Paper Abstract and Keywords |
Presentation |
2020-09-01 17:20
Study on automatic label masking method for plant specimen images using CTPN Depeng Zhang, Yasuhiko Higaki, Yasuo Sugai (Chiba Univ.) LOIS2020-8 IE2020-20 EMM2020-32 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this study, the image processing required for registration of the Haginiwa plant specimen image database in c-arc. Since Haginiwa plant specimens include rare plant specimens, important information such as the collection site cannot be disclosed and must be masked. Up to now, we have been experimenting with a label position identification method that utilizes character recognition, but sufficient accuracy has not been obtained. In order to solve this problem, we consider an automatic image processing method based on deep learning. In this research, we use the text detection network CTPN, the text on the label was detected and the position of the label was tried, and this method obtained a valid result. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Plant specimen image / Deep learning / Automatic masking / Text detection / CTPN / / / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 149, LOIS2020-8, pp. 19-24, Sept. 2020. |
Paper # |
LOIS2020-8 |
Date of Issue |
2020-08-25 (LOIS, IE, EMM) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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LOIS2020-8 IE2020-20 EMM2020-32 |
Conference Information |
Committee |
LOIS EMM IE IEE-CMN ITE-ME IPSJ-AVM |
Conference Date |
2020-09-01 - 2020-09-02 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
LOIS |
Conference Code |
2020-09-LOIS-EMM-IE-CMN-ME-AVM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Study on automatic label masking method for plant specimen images using CTPN |
Sub Title (in English) |
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Keyword(1) |
Plant specimen image |
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Deep learning |
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Automatic masking |
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Text detection |
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CTPN |
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1st Author's Name |
Depeng Zhang |
1st Author's Affiliation |
Chiba University (Chiba Univ.) |
2nd Author's Name |
Yasuhiko Higaki |
2nd Author's Affiliation |
Chiba University (Chiba Univ.) |
3rd Author's Name |
Yasuo Sugai |
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Chiba University (Chiba Univ.) |
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Speaker |
Author-1 |
Date Time |
2020-09-01 17:20:00 |
Presentation Time |
25 minutes |
Registration for |
LOIS |
Paper # |
LOIS2020-8, IE2020-20, EMM2020-32 |
Volume (vol) |
vol.120 |
Number (no) |
no.149(LOIS), no.150(IE), no.151(EMM) |
Page |
pp.19-24 |
#Pages |
6 |
Date of Issue |
2020-08-25 (LOIS, IE, EMM) |
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