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| Presentation | 2020-07-17 13:30 Device identification based on RF circuit imperfections Taisei Nakada, Ryota Shinoda, Yuichi Miyaji, Hideyuki Uehara (TUT)  CS2020-31 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this report we introduce device identification based on physical information specific to wireless devices, which is a promising technique for enhancing IoT security. The first method uses nonlinear distortions caused by power amplifiers (PAs) as a feature value using a Logarithmic-Swept Sine wave (Log-SS) signal, which is a signal for measuring impulse response. The other one uses the frequency offset and I/Q imbalance as a feature value extracted from the received I/Q signal. With these methods, we obtained high identification accuracy with 11 software radios or 17 ZigBee devices. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Device identification / IoT / Physical layer security / nonlinear distortion / Frequency offset / I/Q imbalance / Machine learning / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 107, CS2020-31, pp. 61-66, July 2020. | |
| Paper # | CS2020-31 | |
| Date of Issue | 2020-07-09 (CS) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CS2020-31 |
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| Conference Information | |
| Committee | CS |
| Conference Date | 2020-07-16 - 2020-07-17 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ripura(Rishiri Fuji) |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Next Generation Networks, Access Networks, Broadband Access, Power Line Communications, Wireless Communication Systems, Coding Systems, etc. |
| Paper Information | |
| Registration To | CS |
| Conference Code | 2020-07-CS |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Device identification based on RF circuit imperfections |
| Sub Title (in English) | |
| Keyword(1) | Device identification |
| Keyword(2) | IoT |
| Keyword(3) | Physical layer security |
| Keyword(4) | nonlinear distortion |
| Keyword(5) | Frequency offset |
| Keyword(6) | I/Q imbalance |
| Keyword(7) | Machine learning |
| Keyword(8) | |
| 1st Author's Name | Taisei Nakada |
| 1st Author's Affiliation | Toyohashi University of Technology (TUT) |
| 2nd Author's Name | Ryota Shinoda |
| 2nd Author's Affiliation | Toyohashi University of Technology (TUT) |
| 3rd Author's Name | Yuichi Miyaji |
| 3rd Author's Affiliation | Toyohashi University of Technology (TUT) |
| 4th Author's Name | Hideyuki Uehara |
| 4th Author's Affiliation | Toyohashi University of Technology (TUT) |
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| Speaker | Author-4 |
| Date Time | 2020-07-17 13:30:00 |
| Presentation Time | 20 minutes |
| Registration for | CS |
| Paper # | CS2020-31 |
| Volume (vol) | vol.120 |
| Number (no) | no.107 |
| Page | pp.61-66 |
| #Pages | 6 |
| Date of Issue | 2020-07-09 (CS) |
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