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Paper Abstract and Keywords
Presentation 2020-02-26 14:10
A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92
Abstract (in Japanese) (See Japanese page) 
(in English) Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test generation methods using X-identification and X-filling techniques have been proposed to reduce capture power dissipation. Optimization problems for these two techniques to reduce low capture power dissipation are independently considered. Therefore, the efficiency of low capture power test generation using X-filling depends on the applied results of X-identification. In this paper, we propose an X-identification-filling co-optimization method to reduce the number of capture-unsafe test vectors using Partial MaxSAT Solver. The method assigns logic values to X-bits in order to justify values assigned to propagate target faults to pseudo primary outputs and to reduce the number of transitions on as many internal signal lines as possible. Experimental results show that our proposed method reduced the number of capture unsafe test vectors by 31.63% and the number of unsafe faults by 31.84% on average.
Keyword (in Japanese) (See Japanese page) 
(in English) X-identification-filling co-optimization / low capture power / Partial MaxSAT / capture-unsafe test vectors / unsafe faults / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 420, DC2019-92, pp. 37-42, Feb. 2020.
Paper # DC2019-92 
Date of Issue 2020-02-19 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2020-02-26 - 2020-02-26 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To DC 
Conference Code 2020-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT 
Sub Title (in English)  
Keyword(1) X-identification-filling co-optimization  
Keyword(2) low capture power  
Keyword(3) Partial MaxSAT  
Keyword(4) capture-unsafe test vectors  
Keyword(5) unsafe faults  
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1st Author's Name Kenichiro Misawa  
1st Author's Affiliation Nihon Univercity (Nihon Univ)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon Univercity (Nihon Univ)
3rd Author's Name Hiroshi Yamazaki  
3rd Author's Affiliation Nihon Univercity (Nihon Univ)
4th Author's Name Masayoshi Yoshimura  
4th Author's Affiliation Kyouto Sangyo Univercity (Kyouto Sangyo Univ)
5th Author's Name Masayuki Arai  
5th Author's Affiliation Nihon Univercity (Nihon Univ)
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Speaker
Date Time 2020-02-26 14:10:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-DC2019-92 
Volume (vol) IEICE-119 
Number (no) no.420 
Page pp.37-42 
#Pages IEICE-6 
Date of Issue IEICE-DC-2020-02-19 


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