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Paper Abstract and Keywords
Presentation 2020-02-26 15:00
Improving Controllability of Signal Transitions in the High Switching Area of LSI
Jie Shi, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2019-94
Abstract (in Japanese) (See Japanese page) 
(in English) Power consumption in LSI testing is larger than in functional mode. High power consumption causes excessive IR-drop and excessive delay resulting in test malfunction. On the other hand, extremely lower power than in functional mode may reduce detectability of small delay fault. Therefore, LSI test requires appropriate power consumption. The purpose of this work is to improve controllability of power consumption in LSI testing by applying power controlling techniques in specified areas. In this work, we examine the controllability of power consumption in the specified areas.
Keyword (in Japanese) (See Japanese page) 
(in English) at-speed testing / transition delay test / test malfunction / power consumption in LSI testing / controlling test power / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 420, DC2019-94, pp. 49-54, Feb. 2020.
Paper # DC2019-94 
Date of Issue 2020-02-19 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2020-02-26 - 2020-02-26 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2020-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Improving Controllability of Signal Transitions in the High Switching Area of LSI 
Sub Title (in English)  
Keyword(1) at-speed testing  
Keyword(2) transition delay test  
Keyword(3) test malfunction  
Keyword(4) power consumption in LSI testing  
Keyword(5) controlling test power  
1st Author's Name Jie Shi  
1st Author's Affiliation Kyushu Institute of Technology (Kyutech)
2nd Author's Name Kohei Miyase  
2nd Author's Affiliation Kyushu Institute of Technology (Kyutech)
3rd Author's Name Xiaoqing Wen  
3rd Author's Affiliation Kyushu Institute of Technology (Kyutech)
4th Author's Name Seiji Kajihara  
4th Author's Affiliation Kyushu Institute of Technology (Kyutech)
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Date Time 2020-02-26 15:00:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-DC2019-94 
Volume (vol) IEICE-119 
Number (no) no.420 
Page pp.49-54 
#Pages IEICE-6 
Date of Issue IEICE-DC-2020-02-19 

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