IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2019-11-28 14:35
Process-Oriented Software Reliability Modeling with Debugging Difficulties
Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2019-45
Abstract (in Japanese) (See Japanese page) 
(in English) We discuss software reliability growth modeling by considering the relationship between the debugging process, which mainly consists of the software failure observation, cause analysis and fault removal, and the software reliability growth process observed. Especially, we describe a software debugging process with the debugging difficulties by applying the notion of phase-type probability distribution. Further, we propose a few specific models for software reliability measurement by considering several debugging processes with the debugging difficulty respectively based on the notion of a phase-type probability distribution. We show that our models have better fitting performance compared with well-known the related existing model, which has been developed by focusing on the debugging process, by conducting goodness-of-fit comparisons using actual software counting data, and consider the usefulness of the debugging process-oriented software reliability growth modeling approach.
Keyword (in Japanese) (See Japanese page) 
(in English) Software reliability assessment / Phase-type probability distribution / Debugging process / Debugging difficulty / Goodness-of-fit compassions / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 315, R2019-45, pp. 13-18, Nov. 2019.
Paper # R2019-45 
Date of Issue 2019-11-21 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2019-45

Conference Information
Committee R  
Conference Date 2019-11-28 - 2019-11-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Central Electric Club 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability of semiconductor and electronic devices, Reliability general 
Paper Information
Registration To R 
Conference Code 2019-11-R 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Process-Oriented Software Reliability Modeling with Debugging Difficulties 
Sub Title (in English)  
Keyword(1) Software reliability assessment  
Keyword(2) Phase-type probability distribution  
Keyword(3) Debugging process  
Keyword(4) Debugging difficulty  
Keyword(5) Goodness-of-fit compassions  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Shinji Inoue  
1st Author's Affiliation Kansai University (Kansai Univ.)
2nd Author's Name Shigeru Yamada  
2nd Author's Affiliation Tottori University (Tottori Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2019-11-28 14:35:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2019-45 
Volume (vol) vol.119 
Number (no) no.315 
Page pp.13-18 
#Pages
Date of Issue 2019-11-21 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan