Paper Abstract and Keywords |
Presentation |
2019-11-28 14:10
Non-homogeneous Markov Process Modeling for Software Reliability Assessment Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima U.) R2019-44 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this paper, we focus on non-homogeneous Markov processes, which are generalizations of the well-known non-homogeneous Poisson processes, and compare two software reliability models (SRMs) classified into a generalized binomial process (GBP) and a generalized Polya process (GPP). GBP and GPP can be characterized respectively as a Markov death process and a Markov birth process, with state and time dependent transition rates. Through numerical examples with the fault count data observed in actual software development projects, we compare the two SRMs in terms of the goodness-of-fit performances. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Software reliability models / non-homogeneousMarkov processes / Kolmogorov forward equations / Markov property / goodness-of-fit performance / / / |
Reference Info. |
IEICE Tech. Rep., vol. 119, no. 315, R2019-44, pp. 7-12, Nov. 2019. |
Paper # |
R2019-44 |
Date of Issue |
2019-11-21 (R) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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R2019-44 |
Conference Information |
Committee |
R |
Conference Date |
2019-11-28 - 2019-11-28 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Central Electric Club |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Reliability of semiconductor and electronic devices, Reliability general |
Paper Information |
Registration To |
R |
Conference Code |
2019-11-R |
Language |
English (Japanese title is available) |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Non-homogeneous Markov Process Modeling for Software Reliability Assessment |
Sub Title (in English) |
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Keyword(1) |
Software reliability models |
Keyword(2) |
non-homogeneousMarkov processes |
Keyword(3) |
Kolmogorov forward equations |
Keyword(4) |
Markov property |
Keyword(5) |
goodness-of-fit performance |
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1st Author's Name |
Siqiao Li |
1st Author's Affiliation |
Hiroshima University (Hiroshima U.) |
2nd Author's Name |
Tadashi Dohi |
2nd Author's Affiliation |
Hiroshima University (Hiroshima U.) |
3rd Author's Name |
Hiroyuki Okamura |
3rd Author's Affiliation |
Hiroshima University (Hiroshima U.) |
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Speaker |
Author-1 |
Date Time |
2019-11-28 14:10:00 |
Presentation Time |
25 minutes |
Registration for |
R |
Paper # |
R2019-44 |
Volume (vol) |
vol.119 |
Number (no) |
no.315 |
Page |
pp.7-12 |
#Pages |
6 |
Date of Issue |
2019-11-21 (R) |