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Paper Abstract and Keywords
Presentation 2019-11-22 13:25
Dislocation density dependence of optical gain and internal loss in UV-B region AlGaN active layer
Shunya Tanaka, Yuta Kawase (Meijo Univ.), Kosuke Sato (Asahi-Kasei/Meijo Univ.), Shinji Yasue, Shohei Teramura, Yuya Ogino (Meijo Univ.), Sho Iwayama (Meijo Univ./Mie Univ.), Motoaki Iwaya, Tetsuya Takeuchi, Satoshi Kamiyama (Meijo Univ.), Isamu Akasaki (Meijo Univ./Akasaki Research Center, Nagoya Univ.), Hideto Miyake (Mie Univ.) ED2019-55 CPM2019-74 LQE2019-98 Link to ES Tech. Rep. Archives: ED2019-55 CPM2019-74 LQE2019-98
Abstract (in Japanese) (See Japanese page) 
(in English) The dependence of threshold pumping power density, optical gain, and internal loss on the dislocation density of AlGaN-based UV-B optically pumped laser was investigated. It was confirmed that the laser oscillation threshold was reduced by reducing the dislocation density. In addition, variable stripe length (VSL) measurement confirmed that low dislocation not only increased the optical gain due to non-radiative recombination reduction but also reduced internal loss. Therefore, it was confirmed that low dislocation resulted in not only a large optical gain by low carrier injection but also a reduction in internal loss, resulting in a large laser oscillation threshold. The reduction of internal loss can be explained by a scattering model based on the increase in refractive index fluctuation formed by dislocation itself.
Keyword (in Japanese) (See Japanese page) 
(in English) MOVPE / AlGaN / UV laser / VSL measurement / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 304, LQE2019-98, pp. 93-96, Nov. 2019.
Paper # LQE2019-98 
Date of Issue 2019-11-14 (ED, CPM, LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF ED2019-55 CPM2019-74 LQE2019-98 Link to ES Tech. Rep. Archives: ED2019-55 CPM2019-74 LQE2019-98

Conference Information
Committee CPM LQE ED  
Conference Date 2019-11-21 - 2019-11-22 
Place (in Japanese) (See Japanese page) 
Place (in English) Shizuoka Univ. (Hamamatsu) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Nitride Semiconductor Devices, Materials, Related Technologies 
Paper Information
Registration To LQE 
Conference Code 2019-11-CPM-LQE-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Dislocation density dependence of optical gain and internal loss in UV-B region AlGaN active layer 
Sub Title (in English)  
Keyword(1) MOVPE  
Keyword(2) AlGaN  
Keyword(3) UV laser  
Keyword(4) VSL measurement  
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1st Author's Name Shunya Tanaka  
1st Author's Affiliation Meijo University (Meijo Univ.)
2nd Author's Name Yuta Kawase  
2nd Author's Affiliation Meijo University (Meijo Univ.)
3rd Author's Name Kosuke Sato  
3rd Author's Affiliation Asahi Kasei Corporation/Meijo University (Asahi-Kasei/Meijo Univ.)
4th Author's Name Shinji Yasue  
4th Author's Affiliation Meijo University (Meijo Univ.)
5th Author's Name Shohei Teramura  
5th Author's Affiliation Meijo University (Meijo Univ.)
6th Author's Name Yuya Ogino  
6th Author's Affiliation Meijo University (Meijo Univ.)
7th Author's Name Sho Iwayama  
7th Author's Affiliation Meijo University/Mie University (Meijo Univ./Mie Univ.)
8th Author's Name Motoaki Iwaya  
8th Author's Affiliation Meijo University (Meijo Univ.)
9th Author's Name Tetsuya Takeuchi  
9th Author's Affiliation Meijo University (Meijo Univ.)
10th Author's Name Satoshi Kamiyama  
10th Author's Affiliation Meijo University (Meijo Univ.)
11th Author's Name Isamu Akasaki  
11th Author's Affiliation Meijo University/Akasaki Research Center, Nagoya University (Meijo Univ./Akasaki Research Center, Nagoya Univ.)
12th Author's Name Hideto Miyake  
12th Author's Affiliation Mie University (Mie Univ.)
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Speaker Author-1 
Date Time 2019-11-22 13:25:00 
Presentation Time 20 minutes 
Registration for LQE 
Paper # ED2019-55, CPM2019-74, LQE2019-98 
Volume (vol) vol.119 
Number (no) no.302(ED), no.303(CPM), no.304(LQE) 
Page pp.93-96 
#Pages
Date of Issue 2019-11-14 (ED, CPM, LQE) 


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