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| Presentation | 2019-11-14 09:15 NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement Takumi Hosaka (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), RYO Kishida (Tokyo Univ. of Science), Takashi Matsumoto (The Univ. of Tokyo), Kazutoshi Kobayashi (Kyoto Institute of Tech.)  VLD2019-35 DC2019-59 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this paper, simple and compact Negative Bias Temperature Instability (NBTI) model is proposed. The model is based on the reaction-diffusion (tn) and hole-trapping (log(t)) theories. Data with a single shot of DC stress and recovery are utilized to extract model parameters. Our key idea is setting the priority in the model fitting process to be possible for replicating AC dependency of NBTI stress and recovery effect. The proposed model successfully replicates stress and recovery with various duty cycles. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | negative bias temperature instability (NBTI) / AC stress dependency / reaction diffusion / hole trapping / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 119, no. 282, VLD2019-35, pp. 57-62, Nov. 2019. | |
| Paper # | VLD2019-35 | |
| Date of Issue | 2019-11-06 (VLD, DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2019-35 DC2019-59 |
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| Conference Information | |
| Committee | VLD DC CPSY RECONF ICD IE IPSJ-SLDM IPSJ-EMB |
| Conference Date | 2019-11-13 - 2019-11-15 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Ehime Prefecture Gender Equality Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Gaia 2019 -New Field of VLSI Design- |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2019-11-VLD-DC-CPSY-RECONF-ICD-IE-SLDM-EMB-ARC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement |
| Sub Title (in English) | |
| Keyword(1) | negative bias temperature instability (NBTI) |
| Keyword(2) | AC stress dependency |
| Keyword(3) | reaction diffusion |
| Keyword(4) | hole trapping |
| Keyword(5) | |
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| 1st Author's Name | Takumi Hosaka |
| 1st Author's Affiliation | Saitama University (Saitama Univ.) |
| 2nd Author's Name | Shinichi Nishizawa |
| 2nd Author's Affiliation | Fukuoka University (Fukuoka Univ.) |
| 3rd Author's Name | RYO Kishida |
| 3rd Author's Affiliation | Tokyo university of Science (Tokyo Univ. of Science) |
| 4th Author's Name | Takashi Matsumoto |
| 4th Author's Affiliation | The University of Tokyo (The Univ. of Tokyo) |
| 5th Author's Name | Kazutoshi Kobayashi |
| 5th Author's Affiliation | Kyoto Institute of Technology (Kyoto Institute of Tech.) |
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| Speaker | Author-1 |
| Date Time | 2019-11-14 09:15:00 |
| Presentation Time | 25 minutes |
| Registration for | VLD |
| Paper # | VLD2019-35, DC2019-59 |
| Volume (vol) | vol.119 |
| Number (no) | no.282(VLD), no.283(DC) |
| Page | pp.57-62 |
| #Pages | 6 |
| Date of Issue | 2019-11-06 (VLD, DC) |
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