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Paper Abstract and Keywords
Presentation 2019-11-08 13:30
[Invited Talk] Three-dimensional accurate TCAD simulation of trench-gate Si-IGBTs
Masahiro Watanabe, Naoyuki Shigyo, Takuya Hoshii, Kazuyoshi Furukawa, Kuniyuki Kakushima (Tokyo Tech.), Katsumi Satoh (Mitsubishi Electric Corp.), Tomoko Matsudai (Toshiba Electronic Devices & Storage Corp.), Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (The University of Tokyo), Iriya Muneta, Hitoshi Wakabayashi (Tokyo Tech.), Akira Nakajima (AIST), Shin-ichi Nishizawa (Kyushu University, Kasuga), Kazuo Tsutsui (Tokyo Tech.), Toshiro Hiramoto (The University of Tokyo), Hiromichi Ohashi, Hiroshi Iwai (Tokyo Tech.) SDM2019-77 Link to ES Tech. Rep. Archives: SDM2019-77
Abstract (in Japanese) (See Japanese page) 
(in English) In this work, excellent agreement between 3D TCAD simulations and experimental current-voltage characteristics were obtained in the up to 1000 A/cm$^2$ region for insulated gate bipolar transistors (IGBTs) with scaled trench-gates. The results of 2D and 3D simulations are compared to discuss the difference in current-voltage characteristics and their physical origins. A method to evaluate the saturation current (JCsat) using a 2D simulation is also presented with an appropriate correction.
Keyword (in Japanese) (See Japanese page) 
(in English) Silicon Power Device / IGBT / Scaling / TCAD / Simulation / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 273, SDM2019-77, pp. 45-48, Nov. 2019.
Paper # SDM2019-77 
Date of Issue 2019-10-31 (SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF SDM2019-77 Link to ES Tech. Rep. Archives: SDM2019-77

Conference Information
Committee SDM  
Conference Date 2019-11-07 - 2019-11-08 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit simulation, etc. 
Paper Information
Registration To SDM 
Conference Code 2019-11-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Three-dimensional accurate TCAD simulation of trench-gate Si-IGBTs 
Sub Title (in English)  
Keyword(1) Silicon Power Device  
Keyword(2) IGBT  
Keyword(3) Scaling  
Keyword(4) TCAD  
Keyword(5) Simulation  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Masahiro Watanabe  
1st Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
2nd Author's Name Naoyuki Shigyo  
2nd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
3rd Author's Name Takuya Hoshii  
3rd Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
4th Author's Name Kazuyoshi Furukawa  
4th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
5th Author's Name Kuniyuki Kakushima  
5th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
6th Author's Name Katsumi Satoh  
6th Author's Affiliation Mitsubishi Electric Corp. (Mitsubishi Electric Corp.)
7th Author's Name Tomoko Matsudai  
7th Author's Affiliation Toshiba Electronic Devices & Storage Corp. (Toshiba Electronic Devices & Storage Corp.)
8th Author's Name Takuya Saraya  
8th Author's Affiliation The University of Tokyo (The University of Tokyo)
9th Author's Name Toshihiko Takakura  
9th Author's Affiliation The University of Tokyo (The University of Tokyo)
10th Author's Name Kazuo Itou  
10th Author's Affiliation The University of Tokyo (The University of Tokyo)
11th Author's Name Munetoshi Fukui  
11th Author's Affiliation The University of Tokyo (The University of Tokyo)
12th Author's Name Shinichi Suzuki  
12th Author's Affiliation The University of Tokyo (The University of Tokyo)
13th Author's Name Kiyoshi Takeuchi  
13th Author's Affiliation The University of Tokyo (The University of Tokyo)
14th Author's Name Iriya Muneta  
14th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
15th Author's Name Hitoshi Wakabayashi  
15th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
16th Author's Name Akira Nakajima  
16th Author's Affiliation Nat. Inst. Advanced Industrial Science and Technology (AIST)
17th Author's Name Shin-ichi Nishizawa  
17th Author's Affiliation Kyushu University, Kasuga (Kyushu University, Kasuga)
18th Author's Name Kazuo Tsutsui  
18th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
19th Author's Name Toshiro Hiramoto  
19th Author's Affiliation The University of Tokyo (The University of Tokyo)
20th Author's Name Hiromichi Ohashi  
20th Author's Affiliation Tokyo Institute of Technology (Tokyo Tech.)
Speaker Author-1 
Date Time 2019-11-08 13:30:00 
Presentation Time 60 minutes 
Registration for SDM 
Paper # SDM2019-77 
Volume (vol) vol.119 
Number (no) no.273 
Page pp.45-48 
#Pages
Date of Issue 2019-10-31 (SDM) 


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