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Paper Abstract and Keywords
Presentation 2019-10-24 13:15
Optical Response Analysis of Mixed Thin Films -- Relationship Between Thin Film Structure and Plazmon Excitation in Kretschmann Arrangement --
Tomohiro Tamaru, Di Wu, Seiya Kishimoto, Yoshito Ashizawa, Katsuji Nakagawa, Shinichiro Ohnuki (Nihon Univ) EMCJ2019-44 MW2019-73 EST2019-52
Abstract (in Japanese) (See Japanese page) 
(in English) Electromagnetic field simulation using mixed thin films in the kretschmann configuration is important for understanding optical response of various media consisted of mixed thin films. In this paper, electromagnetic field analysis of kretschmann arrangement using mixed thin film composed of multiple metallic media is performed, and the structure and numerical model of mixed thin film are studied. The FDFD (Finite-Difference Frequency-Domain) method is used for electromagnetic field analysis. The mixed thin film consisted of multiple metal media are spatially arranged according to the composition ratio and a structure in which a single metal thin film is arranged as a mixed medium, and the analysis results are compared. Optical responses are investigated in terms of reflectivity and plasmon excitation.
Keyword (in Japanese) (See Japanese page) 
(in English) Kretschmann Arrangement / Finite-Difference Frequency-Domain Method / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 243, EST2019-52, pp. 45-48, Oct. 2019.
Paper # EST2019-52 
Date of Issue 2019-10-17 (EMCJ, MW, EST) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMCJ2019-44 MW2019-73 EST2019-52

Conference Information
Conference Date 2019-10-24 - 2019-10-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Tohoku Gakuin University(Conf. Room 2, Eng. Bldg. 1) 
Topics (in Japanese) (See Japanese page) 
Topics (in English) EMC, Microwave, Electromagnetic field simulation. 
Paper Information
Registration To EST 
Conference Code 2019-10-EMCJ-MW-EST-EMC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Optical Response Analysis of Mixed Thin Films 
Sub Title (in English) Relationship Between Thin Film Structure and Plazmon Excitation in Kretschmann Arrangement 
Keyword(1) Kretschmann Arrangement  
Keyword(2) Finite-Difference Frequency-Domain Method  
1st Author's Name Tomohiro Tamaru  
1st Author's Affiliation Nihon University (Nihon Univ)
2nd Author's Name Di Wu  
2nd Author's Affiliation Nihon University (Nihon Univ)
3rd Author's Name Seiya Kishimoto  
3rd Author's Affiliation Nihon University (Nihon Univ)
4th Author's Name Yoshito Ashizawa  
4th Author's Affiliation Nihon University (Nihon Univ)
5th Author's Name Katsuji Nakagawa  
5th Author's Affiliation Nihon University (Nihon Univ)
6th Author's Name Shinichiro Ohnuki  
6th Author's Affiliation Nihon University (Nihon Univ)
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Date Time 2019-10-24 13:15:00 
Presentation Time 20 
Registration for EST 
Paper # IEICE-EMCJ2019-44,IEICE-MW2019-73,IEICE-EST2019-52 
Volume (vol) IEICE-119 
Number (no) no.241(EMCJ), no.242(MW), no.243(EST) 
Page pp.45-48 
#Pages IEICE-4 
Date of Issue IEICE-EMCJ-2019-10-17,IEICE-MW-2019-10-17,IEICE-EST-2019-10-17 

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