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Paper Abstract and Keywords
Presentation 2019-07-24 09:55
Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage
Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43
Abstract (in Japanese) (See Japanese page) 
(in English) The threats of electromagnetic (EM) information leakage from the input/output (I/O) signal of an IC mounted on a de-vice have been reported. The above attack is caused when attackers irradiate an EM wave of the specific frequency against properly implemented I/O circuits. Then, properly circuits behave like hardware Trojan. To be feasible the above-mentioned attack, conventional studies have searched for the broad frequency range to find frequencies availa-ble for the attack. However, this search required a lot of time. In this paper, we propose a method to estimate frequencies available for the attack by focusing on the physical structure of the device without searching for the broad frequency range. In an experiment, we measured the length of the connected line and the length of around the peripheral devices of a target device. Based on the above measurement, we extracted resonance frequencies corresponding to the total length of the target device as frequencies available for the attack. Moreover, we confirmed that EM information leakage of the I/O signal of the IC by irradiating not only the estimated frequency but also its harmonics.
Keyword (in Japanese) (See Japanese page) 
(in English) Electromagnetic Information Leakage / Hardware Trojan / Intentional Electromagnetic Interference / / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 143, HWS2019-35, pp. 235-238, July 2019.
Paper # HWS2019-35 
Date of Issue 2019-07-16 (ISEC, SITE, BioX, HWS, ICSS, EMM) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43

Conference Information
Conference Date 2019-07-23 - 2019-07-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Kochi University of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2019-07-ISEC-SITE-ICSS-EMM-HWS-BioX-CSEC-SPT 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage 
Sub Title (in English)  
Keyword(1) Electromagnetic Information Leakage  
Keyword(2) Hardware Trojan  
Keyword(3) Intentional Electromagnetic Interference  
1st Author's Name Shugo Kaji  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Masahiro Kinugawa  
2nd Author's Affiliation National Institute of Technology, Sendai College (NIT)
3rd Author's Name Daisuke Fujimoto  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Yu-ichi Hayashi  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Date Time 2019-07-24 09:55:00 
Presentation Time 25 
Registration for HWS 
Paper # IEICE-ISEC2019-40,IEICE-SITE2019-34,IEICE-BioX2019-32,IEICE-HWS2019-35,IEICE-ICSS2019-38,IEICE-EMM2019-43 
Volume (vol) IEICE-119 
Number (no) no.140(ISEC), no.141(SITE), no.142(BioX), no.143(HWS), no.144(ICSS), no.145(EMM) 
Page pp.235-238 
#Pages IEICE-4 
Date of Issue IEICE-ISEC-2019-07-16,IEICE-SITE-2019-07-16,IEICE-BioX-2019-07-16,IEICE-HWS-2019-07-16,IEICE-ICSS-2019-07-16,IEICE-EMM-2019-07-16 

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