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Paper Abstract and Keywords
Presentation 2019-07-19 11:25
[Invited Lecture] Development of High Frequency Electric Field Sensor with Optically Modulated Scattering Technique and its Application to EMC Noise Scanner
Takahiro Kurosawa (AITC), Takashi Komakine (Akita NCT)
Abstract (in Japanese) (See Japanese page) 
(in English) Electric field measurement sensor based on the modulated scattering technique with optically modulated scatterer had developed. The scattered wave by the semiconductor scatterer was modulated with the light which has higher energy than the band-gap energy of the semiconductor. By using germanium disk as the scatterer, microwave field could be detected in the frequency range of 1-18 GHz. On near field measurements, distribution of the in-plane field component on the microstrip line and the patch antenna could be measured. This sensor was adopted to the EMC scanner, which could measure the microwave electric field distribution on electric equipment. Measurement of the field distribution on the giga-bit ethernet switching hub was demonstrated.
Keyword (in Japanese) (See Japanese page) 
(in English) electric field measurement / modulated scattering / semiconductor scatterer / microwave field / EMC scanner / / /  
Reference Info. IEICE Tech. Rep.
Paper #  
Date of Issue  
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Committee EMCJ EMD WPT PEM  
Conference Date 2019-07-19 - 2019-07-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To PEM 
Conference Code 2019-07-EMCJ-EMD-WPT-PEM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Development of High Frequency Electric Field Sensor with Optically Modulated Scattering Technique and its Application to EMC Noise Scanner 
Sub Title (in English)  
Keyword(1) electric field measurement  
Keyword(2) modulated scattering  
Keyword(3) semiconductor scatterer  
Keyword(4) microwave field  
Keyword(5) EMC scanner  
1st Author's Name Takahiro Kurosawa  
1st Author's Affiliation AKITA Industrial Technology Center (AITC)
2nd Author's Name Takashi Komakine  
2nd Author's Affiliation National Institute of Technology, Akita College (Akita NCT)
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Date Time 2019-07-19 11:25:00 
Presentation Time 25 
Registration for PEM 
Paper #  
Volume (vol) IEICE-119 
Number (no)  
#Pages IEICE-4 
Date of Issue  

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