IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2019-03-02 13:30
An Instrumentation Security Metric for ToF Depth-Image Cameras
Satoru Sakurazawa, Daisuke Fujimoto, Tsutomu Matsumoto (YNU) VLD2018-141 HWS2018-104
Abstract (in Japanese) (See Japanese page) 
(in English) We are constructing a system for evaluating instrumentation security of ToF Depth-Image Cameras based on pulse-light spoofing. In this paper, we introduce the attack potential rating in vulnerability evaluation of Common Criteria to the system as an instrumentation security metric.
Keyword (in Japanese) (See Japanese page) 
(in English) Instrumentation Security / Time of Flight / Depth-Image Camera / Security Evaluation / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 458, HWS2018-104, pp. 283-288, Feb. 2019.
Paper # HWS2018-104 
Date of Issue 2019-02-20 (VLD, HWS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2018-141 HWS2018-104

Conference Information
Committee HWS VLD  
Conference Date 2019-02-27 - 2019-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Ken Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon, Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2019-02-HWS-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Instrumentation Security Metric for ToF Depth-Image Cameras 
Sub Title (in English)  
Keyword(1) Instrumentation Security  
Keyword(2) Time of Flight  
Keyword(3) Depth-Image Camera  
Keyword(4) Security Evaluation  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Satoru Sakurazawa  
1st Author's Affiliation Yokohama National University (YNU)
2nd Author's Name Daisuke Fujimoto  
2nd Author's Affiliation Yokohama National University (YNU)
3rd Author's Name Tsutomu Matsumoto  
3rd Author's Affiliation Yokohama National University (YNU)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2019-03-02 13:30:00 
Presentation Time 25 minutes 
Registration for HWS 
Paper # VLD2018-141, HWS2018-104 
Volume (vol) vol.118 
Number (no) no.457(VLD), no.458(HWS) 
Page pp.283-288 
#Pages
Date of Issue 2019-02-20 (VLD, HWS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan