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Paper Abstract and Keywords
Presentation 2019-02-28 15:20
A SPICE Model Parameter Extraction Environment Using Automatic Differentiation
Aoi Ueda (NNCT), Michihiro Shintani (NAIST), Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT), Michiko Inoue (NAIST) VLD2018-117 HWS2018-80
Abstract (in Japanese) (See Japanese page) 
(in English) Accuracy of circuit simulation highly relys on two techniques: compact modeling and parameter extraction. As increasing the complexity of the compact model and the number of model parameters, the parameter extraction is becoming a time-consuming step. In this paper, we propose an automatic environment of automatic-differentiation-based parameter extraction. While the automatic differentiation enables us to accerelate the parameter extraction, the model equation needs to be represented by a calculation graph. The proposed environment automatically generates the calculation graph of the given compact model, and conducts the parameter extraction based on the gradient method. Through experiments using a surface potential model which represents physical behavior of the MOSFET, we demonstrate that our environment achieved 7.94x speedup with preserving the fitting error compared to the numerical-differentiation-based parameter extraction.
Keyword (in Japanese) (See Japanese page) 
(in English) Parameter extraction / Compact model / Current characteristics / Gradient method / Automatic differentiation / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 457, VLD2018-117, pp. 145-150, Feb. 2019.
Paper # VLD2018-117 
Date of Issue 2019-02-20 (VLD, HWS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2018-117 HWS2018-80

Conference Information
Committee HWS VLD  
Conference Date 2019-02-27 - 2019-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Ken Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon, Hardware Security, etc. 
Paper Information
Registration To VLD 
Conference Code 2019-02-HWS-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A SPICE Model Parameter Extraction Environment Using Automatic Differentiation 
Sub Title (in English)  
Keyword(1) Parameter extraction  
Keyword(2) Compact model  
Keyword(3) Current characteristics  
Keyword(4) Gradient method  
Keyword(5) Automatic differentiation  
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1st Author's Name Aoi Ueda  
1st Author's Affiliation National Institute of Technology , Nara College (NNCT)
2nd Author's Name Michihiro Shintani  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Hiroshi Iwata  
3rd Author's Affiliation National Institute of Technology , Nara College (NNCT)
4th Author's Name Ken'ichi Yamaguchi  
4th Author's Affiliation National Institute of Technology , Nara College (NNCT)
5th Author's Name Michiko Inoue  
5th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2019-02-28 15:20:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2018-117, HWS2018-80 
Volume (vol) vol.118 
Number (no) no.457(VLD), no.458(HWS) 
Page pp.145-150 
#Pages
Date of Issue 2019-02-20 (VLD, HWS) 


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