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Paper Abstract and Keywords
Presentation 2019-02-28 16:45
Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations
Shugo Kaji (NAIST), Masahiro kinugawa (NIT), Daisuke Fujimoto (NAIST), Laurent Sauvage, Jean-Luc Danger (Telecom ParisTech), Yu-ichi Hayashi (NAIST) VLD2018-120 HWS2018-83
Abstract (in Japanese) (See Japanese page) 
(in English) There is a possibility that electronic devices which contain counterfeited/cloned ICs or electronic components cause serious accidents. For this reason, the authentication methods using physical features that make difficult to clone during the manufacturing process of the semiconductor devices are studied. These authentication methods mainly focus the IC-level authenticity. In this paper, we propose a method to provide the board-level authenticity of electronic devices by authentication focusing on the difference of radiation spectrum caused by manufacturing/mounting variations of electronic devices. Specifically, we demonstrate that the fundamental and harmonic wave of the radiated electromagnetic wave generated by the identification signal inside the microcontroller change due to manufacturing/mounting variation of the electronic device. In addition, we evaluate the individual identification method using these differences.
Keyword (in Japanese) (See Japanese page) 
(in English) Device identification / Electromagnetic emission / Manufacturing variation / Mounting variation / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 458, HWS2018-83, pp. 163-167, Feb. 2019.
Paper # HWS2018-83 
Date of Issue 2019-02-20 (VLD, HWS) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee HWS VLD  
Conference Date 2019-02-27 - 2019-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Okinawa Ken Seinen Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Technology for System-on-Silicon, Hardware Security, etc. 
Paper Information
Registration To HWS 
Conference Code 2019-02-HWS-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations 
Sub Title (in English)  
Keyword(1) Device identification  
Keyword(2) Electromagnetic emission  
Keyword(3) Manufacturing variation  
Keyword(4) Mounting variation  
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1st Author's Name Shugo Kaji  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Masahiro kinugawa  
2nd Author's Affiliation National Institute of Technology, Sendai College (NIT)
3rd Author's Name Daisuke Fujimoto  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Laurent Sauvage  
4th Author's Affiliation Telecom ParisTech (Telecom ParisTech)
5th Author's Name Jean-Luc Danger  
5th Author's Affiliation Telecom ParisTech (Telecom ParisTech)
6th Author's Name Yu-ichi Hayashi  
6th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker
Date Time 2019-02-28 16:45:00 
Presentation Time 25 
Registration for HWS 
Paper # IEICE-VLD2018-120,IEICE-HWS2018-83 
Volume (vol) IEICE-118 
Number (no) no.457(VLD), no.458(HWS) 
Page pp.163-167 
#Pages IEICE-5 
Date of Issue IEICE-VLD-2019-02-20,IEICE-HWS-2019-02-20 


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