Paper Abstract and Keywords |
Presentation |
2019-02-27 10:15
Analysis of the hotspot distribution in the LSI Yudai Kawano, Kohei Miyase (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2018-74 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Performance degrading caused by high IR-drop in normal functional mode of LSI can be solved by improving power supply network in layout design phase. However, excessive IR-drop in test mode is not appropriately considered in layout design phase, although the amount of increased IR-drop in test mode is much higher than in normal functional mode. Excessive IR-drop in test mode causes test malfunction which judges fault free LSI in normal functional mode as faulty. In this work, we propose a method to locate high IR-drop areas (Hot Spot) which is necessary to effectively and efficiently reduce excessive IR-drop. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
at-speed testing / test power / IR-drop / over-testing / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 456, DC2018-74, pp. 19-24, Feb. 2019. |
Paper # |
DC2018-74 |
Date of Issue |
2019-02-20 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
DC2018-74 |
Conference Information |
Committee |
DC |
Conference Date |
2019-02-27 - 2019-02-27 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
VLSI Design and Test, etc. |
Paper Information |
Registration To |
DC |
Conference Code |
2019-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Analysis of the hotspot distribution in the LSI |
Sub Title (in English) |
|
Keyword(1) |
at-speed testing |
Keyword(2) |
test power |
Keyword(3) |
IR-drop |
Keyword(4) |
over-testing |
Keyword(5) |
|
Keyword(6) |
|
Keyword(7) |
|
Keyword(8) |
|
1st Author's Name |
Yudai Kawano |
1st Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
2nd Author's Name |
Kohei Miyase |
2nd Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
3rd Author's Name |
Shyue-Kung Lu |
3rd Author's Affiliation |
National Taiwan University of Science & Technology (NTUST) |
4th Author's Name |
Xiaoqing Wen |
4th Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
5th Author's Name |
Seiji Kajihara |
5th Author's Affiliation |
Kyushu Institute of Technology (Kyutech) |
6th Author's Name |
|
6th Author's Affiliation |
() |
7th Author's Name |
|
7th Author's Affiliation |
() |
8th Author's Name |
|
8th Author's Affiliation |
() |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2019-02-27 10:15:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2018-74 |
Volume (vol) |
vol.118 |
Number (no) |
no.456 |
Page |
pp.19-24 |
#Pages |
6 |
Date of Issue |
2019-02-20 (DC) |
|