Paper Abstract and Keywords |
Presentation |
2019-02-27 15:10
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines Yuki Maeda, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (Hiroshima City Univ.) DC2018-81 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Stochastic Computing (SC) has attractive characteristics, compared with deterministic (or general binary) computing, such as smaller area of the implemented circuits, higher fault tolerant, and so on. This study focuses on the transient fault tolerance of SC circuits with linear finite state machines (linear FSMs), and proposes a design of linear FSM-based SC circuits by means of encoding the states with stochastic numbers (SNs) to improve the transient fault tolerability. Moreover, we propose a design of SN-encoding SC circuits with approximate state transition so as to reduce the area overhead of the SN-encoding. These two designs are modeled as Markov chains to clarify their behaviors when any transient fault occurs. Experimental results clarify the error tolerability of SC circuits designed by the proposed methods. From these results, we can see that the SC circuit implementing a hyperbolic tangent function (tanh) has high fault tolerability. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Approximate computing / Markov chain / FF flipping fault / soft error / calculation error / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 456, DC2018-81, pp. 61-66, Feb. 2019. |
Paper # |
DC2018-81 |
Date of Issue |
2019-02-20 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2018-81 |
Conference Information |
Committee |
DC |
Conference Date |
2019-02-27 - 2019-02-27 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
VLSI Design and Test, etc. |
Paper Information |
Registration To |
DC |
Conference Code |
2019-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines |
Sub Title (in English) |
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Keyword(1) |
Approximate computing |
Keyword(2) |
Markov chain |
Keyword(3) |
FF flipping fault |
Keyword(4) |
soft error |
Keyword(5) |
calculation error |
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1st Author's Name |
Yuki Maeda |
1st Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
2nd Author's Name |
Hideyuki Ichihara |
2nd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
3rd Author's Name |
Tsuyoshi Iwagaki |
3rd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
4th Author's Name |
Tomoo Inoue |
4th Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
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Speaker |
Author-1 |
Date Time |
2019-02-27 15:10:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2018-81 |
Volume (vol) |
vol.118 |
Number (no) |
no.456 |
Page |
pp.61-66 |
#Pages |
6 |
Date of Issue |
2019-02-20 (DC) |
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