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Paper Abstract and Keywords
Presentation 2019-02-27 11:45
An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling
Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST) DC2018-77
Abstract (in Japanese) (See Japanese page) 
(in English) Recycled field programmable gate arrays (FPGAs) make a significant threat to mission critical systems due to their performance degradation and shorter lifetime caused by aging. In this paper, we propose a novel recycled FPGA detection method based on with-in die (WID) variation modeling. While fresh/recycled classification is carried out using measured frequencies from ring oscillators on FPGA in existing methods, the proposed method exploits model parameters extracted from the WID modeling. The model parameters simply and accurately represent the process variation of each FPGA, and thus the classification performs very well by the simple feature vector. Experimental results using circuit simulation demonstrate that the proposed method achieves 99.6% dimension reduction per FPGA chip with showing 96.0% detection accuracy using one-class support vector machine (SVM); while our silicon results on Xilinx Artix-7 FPGAs demonstrate the model parameters have good distance properties between fresh and aged.
Keyword (in Japanese) (See Japanese page) 
(in English) Recycled detection / Field programmable gate array (FPGA) / Process variation / With-in die process variation / Feature engineering / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 456, DC2018-77, pp. 37-42, Feb. 2019.
Paper # DC2018-77 
Date of Issue 2019-02-20 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2019-02-27 - 2019-02-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2019-02-DC 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling 
Sub Title (in English)  
Keyword(1) Recycled detection  
Keyword(2) Field programmable gate array (FPGA)  
Keyword(3) Process variation  
Keyword(4) With-in die process variation  
Keyword(5) Feature engineering  
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1st Author's Name Foisal Ahmed  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Michihiro Shintani  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Michiko Inoue  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker
Date Time 2019-02-27 11:45:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-DC2018-77 
Volume (vol) IEICE-118 
Number (no) no.456 
Page pp.37-42 
#Pages IEICE-6 
Date of Issue IEICE-DC-2019-02-20 


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