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Paper Abstract and Keywords
Presentation 2019-02-27 14:05
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79
Abstract (in Japanese) (See Japanese page) 
(in English) Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power-on Self-Test) for achieving high fault coverage and shortening the TAT (Test Application Time). However, the randomness loss of the capture patterns due to the large number of capture cycles obstructs the further improvement of fault coverage. In this paper, we introduce a FF-CPI technique proposed in [19] to enhance the test quality of the capture patterns, and propose an improved selection method of FF candidates for FF-CPI.
Keyword (in Japanese) (See Japanese page) 
(in English) POST / LBIST / Multi-cycle Test / Functional Safety / ISO26262 / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 456, DC2018-79, pp. 49-54, Feb. 2019.
Paper # DC2018-79 
Date of Issue 2019-02-20 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2019-02-27 - 2019-02-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2019-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing 
Sub Title (in English)  
Keyword(1) POST  
Keyword(2) LBIST  
Keyword(3) Multi-cycle Test  
Keyword(4) Functional Safety  
Keyword(5) ISO26262  
1st Author's Name Tomoki Aono  
1st Author's Affiliation Ehime Univercity (Ehime Univ.)
2nd Author's Name Hanan T.Al-Awadhi  
2nd Author's Affiliation Ehime Univercity (Ehime Univ.)
3rd Author's Name Senling Wang  
3rd Author's Affiliation Ehime Univercity (Ehime Univ.)
4th Author's Name Yoshinobu Higami  
4th Author's Affiliation Ehime Univercity (Ehime Univ.)
5th Author's Name Hiroshi Takahashi  
5th Author's Affiliation Ehime Univercity (Ehime Univ.)
6th Author's Name Hiroyuki Iwata  
6th Author's Affiliation Renesas Electronics Company (Renesas)
7th Author's Name Yoichi Maeda  
7th Author's Affiliation Renesas Electronics Company (Renesas)
8th Author's Name Jun Matsushima  
8th Author's Affiliation Renesas Electronics Company (Renesas)
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Date Time 2019-02-27 14:05:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-DC2018-79 
Volume (vol) IEICE-118 
Number (no) no.456 
Page pp.49-54 
#Pages IEICE-6 
Date of Issue IEICE-DC-2019-02-20 

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