Paper Abstract and Keywords |
Presentation |
2019-01-18 10:40
The failure mode analysis on GaN-HEMT under High temperature operation Yasuyo Yotsuda (SEDI), Yasunori Tateno, Takumi Yonemura, Masato Furukawa, Hiroshi Yamamoto (SEI), Yukinori Nose, Satoshi Shimizu (SEDI) ED2018-81 MW2018-148 Link to ES Tech. Rep. Archives: ED2018-81 MW2018-148 |
Abstract |
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Reference Info. |
IEICE Tech. Rep., vol. 118, no. 402, ED2018-81, pp. 67-70, Jan. 2019. |
Paper # |
ED2018-81 |
Date of Issue |
2019-01-10 (ED, MW) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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ED2018-81 MW2018-148 Link to ES Tech. Rep. Archives: ED2018-81 MW2018-148 |
Conference Information |
Committee |
MW ED |
Conference Date |
2019-01-17 - 2019-01-18 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hitachi, Central Research Lab. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Compound semiconductor, High speed and High frequency devices/Microwave technologies |
Paper Information |
Registration To |
ED |
Conference Code |
2019-01-MW-ED |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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Title (in English) |
The failure mode analysis on GaN-HEMT under High temperature operation |
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1st Author's Name |
Yasuyo Yotsuda |
1st Author's Affiliation |
Sumitomo Electric Device Innovations, Inc. (SEDI) |
2nd Author's Name |
Yasunori Tateno |
2nd Author's Affiliation |
Sumitomo Electric Industries, Ltd. (SEI) |
3rd Author's Name |
Takumi Yonemura |
3rd Author's Affiliation |
Sumitomo Electric Industries, Ltd. (SEI) |
4th Author's Name |
Masato Furukawa |
4th Author's Affiliation |
Sumitomo Electric Industries, Ltd. (SEI) |
5th Author's Name |
Hiroshi Yamamoto |
5th Author's Affiliation |
Sumitomo Electric Industries, Ltd. (SEI) |
6th Author's Name |
Yukinori Nose |
6th Author's Affiliation |
Sumitomo Electric Device Innovations, Inc. (SEDI) |
7th Author's Name |
Satoshi Shimizu |
7th Author's Affiliation |
Sumitomo Electric Device Innovations, Inc. (SEDI) |
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Speaker |
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Date Time |
2019-01-18 10:40:00 |
Presentation Time |
25 minutes |
Registration for |
ED |
Paper # |
ED2018-81, MW2018-148 |
Volume (vol) |
vol.118 |
Number (no) |
no.402(ED), no.403(MW) |
Page |
pp.67-70 |
#Pages |
4 |
Date of Issue |
2019-01-10 (ED, MW) |
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