Paper Abstract and Keywords |
Presentation |
2019-01-18 10:50
Results of EMC round robin test on emission and immunity test.
-- (3) Conducted immunity round robin test -- Yoshitsugu Okuda (KEC Electronic Industry Development Center), Yasushi Asaji (Murata Manufacturing), Takashi Usui (YAMAHA), Mikio Okumura (OMRON), Kazuhiro Kobayashi (IPS), Hiroyoshi Shida (Tokin EMC Engineering), Hisashi Ninomiya (Roland), Mitsuyoshi Maishima (Hamamatsu Photonics), Osami Wada (Kyoto Univ) EMCJ2018-100 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
(Not available yet) |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
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Reference Info. |
IEICE Tech. Rep., vol. 118, no. 406, EMCJ2018-100, pp. 1-5, Jan. 2019. |
Paper # |
EMCJ2018-100 |
Date of Issue |
2019-01-11 (EMCJ) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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EMCJ2018-100 |
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