IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2018-12-15 16:25
Which is better to replace at number of works or failures
Satoshi Mizutani, Toshio Nakagawa (AIT) R2018-50
Abstract (in Japanese) (See Japanese page) 
(in English) This paper proposes some replacement policies in which the unit is replaced at $N$th working cycle or $K$th failure. We compare and discuss numerically these expected cost rates. At first, we consider the basic replacement policies for $N$ and $K$. That is, the unit is replaced at $N$th working cycle, and at $K$th failure. Further, we treat following models: replacement first and last models that the unit is replaced at $N$th working cycle or $K$th failure. Overtime policy that the unit is replaced at the time over the $N$th working cycle, and at the time over the $N$th failure. We discuss analytically about optimal $N^*$ and $K^*$ which minimize the expected cost rate, and compare numerically these expected cost rates.
Keyword (in Japanese) (See Japanese page) 
(in English) Replacement Policy / Overtime Replacement Policy / Replacement First / Replacement Last / Minimal Repair / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 365, R2018-50, pp. 41-46, Dec. 2018.
Paper # R2018-50 
Date of Issue 2018-12-08 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2018-50

Conference Information
Committee R  
Conference Date 2018-12-15 - 2018-12-15 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2018-12-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Which is better to replace at number of works or failures 
Sub Title (in English)  
Keyword(1) Replacement Policy  
Keyword(2) Overtime Replacement Policy  
Keyword(3) Replacement First  
Keyword(4) Replacement Last  
Keyword(5) Minimal Repair  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Satoshi Mizutani  
1st Author's Affiliation Aichi Institute of Technology (AIT)
2nd Author's Name Toshio Nakagawa  
2nd Author's Affiliation Aichi Institute of Technology (AIT)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2018-12-15 16:25:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2018-50 
Volume (vol) vol.118 
Number (no) no.365 
Page pp.41-46 
#Pages
Date of Issue 2018-12-08 (R) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan