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Paper Abstract and Keywords
Presentation 2018-12-14 13:00
On-Chip Delay Measurement for In-field Periodic Test of FPGAs
Yousuke Miyake, Yasuo Sato, Seiji Kajihara (KIT)
Abstract (in Japanese) (See Japanese page) 
(in English) Delay-related failures due to aging phenomena are a critical issue of state-of-the-art VLSI systems. In order to detect a delay increase by aging, repeated delay measurement in field is effective. A delay measurement method based on BIST (Built-In Self-Test) with variable test timing generation has been proposed for FPGAs. However, the measured delay in field is influenced of environment factors such as temperature variation. Thus, a correction of temperature influence for the measured delay is required for highly accurate delay measurement. This paper proposes a correction method of temperature influence for a measured delay. The proposed method consists of delay measurement with variable test timing generation and correction of temperature influence with an embedded temperature sensor.
Keyword (in Japanese) (See Japanese page) 
(in English) FPGA / Logic BIST / Delay measurement / Temperature sensor / Field test / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 364, DC2018-58, pp. 1-6, Dec. 2018.
Paper # DC2018-58 
Date of Issue 2018-12-07 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380

Conference Information
Committee DC  
Conference Date 2018-12-14 - 2018-12-14 
Place (in Japanese) (See Japanese page) 
Place (in English) Miyako Seisyonen-No-Ie 
Topics (in Japanese) (See Japanese page) 
Topics (in English) 3rd Winter Workshop on safety 
Paper Information
Registration To DC 
Conference Code 2018-12-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On-Chip Delay Measurement for In-field Periodic Test of FPGAs 
Sub Title (in English)  
Keyword(1) FPGA  
Keyword(2) Logic BIST  
Keyword(3) Delay measurement  
Keyword(4) Temperature sensor  
Keyword(5) Field test  
1st Author's Name Yousuke Miyake  
1st Author's Affiliation Kyushu Institute of Technology (KIT)
2nd Author's Name Yasuo Sato  
2nd Author's Affiliation Kyushu Institute of Technology (KIT)
3rd Author's Name Seiji Kajihara  
3rd Author's Affiliation Kyushu Institute of Technology (KIT)
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Date Time 2018-12-14 13:00:00 
Presentation Time 20 
Registration for DC 
Paper # IEICE-DC2018-58 
Volume (vol) IEICE-118 
Number (no) no.364 
Page pp.1-6 
#Pages IEICE-6 
Date of Issue IEICE-DC-2018-12-07 

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