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| Presentation | 2018-11-22 15:10 [Poster Presentation] Influence of IEMI considering injected signal phase on faulty outputs in a cryptographic module Mitsuki Takenouchi (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.)  EMCJ2018-79 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In a fault injection method based on Intentional Electromagnetic Interference (IEMI) from a power line, the phase of the sinusoidal waves that superimposes on the clock signal depends on the timing of injecting the electromagnetic field. Therefore, the timing of injection may influence fault occurrences and faulty outputs. In this paper, we propose a fault injection method with changing the injected signal phase, and show the influence of controlling the phase and the effectiveness of the proposal method through the experiment. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | fault analysis / intentional electromagnetic interference / DFA / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 118, no. 317, EMCJ2018-79, pp. 61-62, Nov. 2018. | |
| Paper # | EMCJ2018-79 | |
| Date of Issue | 2018-11-15 (EMCJ) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMCJ2018-79 |
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| Conference Information | |
| Committee | EMCJ IEE-EMC IEE-MAG |
| Conference Date | 2018-11-22 - 2018-11-23 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | KAIST |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | EMC Joint Workshop 2018, Daejon |
| Paper Information | |
| Registration To | EMCJ |
| Conference Code | 2018-11-EMCJ-EMC-MAG |
| Language | English (Japanese title is available) |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Influence of IEMI considering injected signal phase on faulty outputs in a cryptographic module |
| Sub Title (in English) | |
| Keyword(1) | fault analysis |
| Keyword(2) | intentional electromagnetic interference |
| Keyword(3) | DFA |
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| 1st Author's Name | Mitsuki Takenouchi |
| 1st Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 2nd Author's Name | Yu-ichi Hayashi |
| 2nd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 3rd Author's Name | Takaaki Mizuki |
| 3rd Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 4th Author's Name | Hideaki Sone |
| 4th Author's Affiliation | Tohoku University (Tohoku Univ.) |
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| Speaker | Author-1 |
| Date Time | 2018-11-22 15:10:00 |
| Presentation Time | 60 minutes |
| Registration for | EMCJ |
| Paper # | EMCJ2018-79 |
| Volume (vol) | vol.118 |
| Number (no) | no.317 |
| Page | pp.61-62 |
| #Pages | 2 |
| Date of Issue | 2018-11-15 (EMCJ) |
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