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Paper Abstract and Keywords
Presentation 2018-10-19 15:05
Examination of dimensionality of multilayer perceptron estimating dislocation regions in multicrystalline silicon photoluminescence image
Hiroaki Kudo, Tetsuya Matsumoto (Nagoya Univ.), Kentaro Kutsukake (RIKEN), Noritaka Usami (Nagoya Univ.) IMQ2018-14
Abstract (in Japanese) (See Japanese page) 
(in English) In this report, we studied a specified method of regions including dislocations which are crystallographic defects in a photoluminescence (PL) image of multicrystalline silicon wafers. We utilized a neural network of multilayer perceptron (MLP) to classify fragmented region in the wafer image to a region including dislocation or not. We examined effects in network's output depending on changes in the numbers of elements of the first hidden layer. In the comparison of conditions using 1 wafer image or 3 wafer images,
we obtained results that the network composed 3 hidden layers and the first hidden layer has about 10 elements with 3 wafers images shows good performance.
Keyword (in Japanese) (See Japanese page) 
(in English) multicrystalline silicon / photoluminescence image / dislocation / multilayer perceptron / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 256, IMQ2018-14, pp. 19-24, Oct. 2018.
Paper # IMQ2018-14 
Date of Issue 2018-10-12 (IMQ) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
技術研究報告に掲載された論文の著作権はIEICEに帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF IMQ2018-14

Conference Information
Committee IMQ  
Conference Date 2018-10-19 - 2018-10-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Visual Perception and IMQ 
Paper Information
Registration To IMQ 
Conference Code 2018-10-IMQ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Examination of dimensionality of multilayer perceptron estimating dislocation regions in multicrystalline silicon photoluminescence image 
Sub Title (in English)  
Keyword(1) multicrystalline silicon  
Keyword(2) photoluminescence image  
Keyword(3) dislocation  
Keyword(4) multilayer perceptron  
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1st Author's Name Hiroaki Kudo  
1st Author's Affiliation Nagoya University (Nagoya Univ.)
2nd Author's Name Tetsuya Matsumoto  
2nd Author's Affiliation Nagoya University (Nagoya Univ.)
3rd Author's Name Kentaro Kutsukake  
3rd Author's Affiliation RIKEN (RIKEN)
4th Author's Name Noritaka Usami  
4th Author's Affiliation Nagoya University (Nagoya Univ.)
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Speaker
Date Time 2018-10-19 15:05:00 
Presentation Time 25 
Registration for IMQ 
Paper # IEICE-IMQ2018-14 
Volume (vol) IEICE-118 
Number (no) no.256 
Page pp.19-24 
#Pages IEICE-6 
Date of Issue IEICE-IMQ-2018-10-12 


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