Paper Abstract and Keywords |
Presentation |
2018-10-19 15:05
Examination of dimensionality of multilayer perceptron estimating dislocation regions in multicrystalline silicon photoluminescence image Hiroaki Kudo, Tetsuya Matsumoto (Nagoya Univ.), Kentaro Kutsukake (RIKEN), Noritaka Usami (Nagoya Univ.) IMQ2018-14 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this report, we studied a specified method of regions including dislocations which are crystallographic defects in a photoluminescence (PL) image of multicrystalline silicon wafers. We utilized a neural network of multilayer perceptron (MLP) to classify fragmented region in the wafer image to a region including dislocation or not. We examined effects in network's output depending on changes in the numbers of elements of the first hidden layer. In the comparison of conditions using 1 wafer image or 3 wafer images,
we obtained results that the network composed 3 hidden layers and the first hidden layer has about 10 elements with 3 wafers images shows good performance. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
multicrystalline silicon / photoluminescence image / dislocation / multilayer perceptron / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 256, IMQ2018-14, pp. 19-24, Oct. 2018. |
Paper # |
IMQ2018-14 |
Date of Issue |
2018-10-12 (IMQ) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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IMQ2018-14 |
Conference Information |
Committee |
IMQ |
Conference Date |
2018-10-19 - 2018-10-19 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kyoto Institute of Technology |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Visual Perception and IMQ |
Paper Information |
Registration To |
IMQ |
Conference Code |
2018-10-IMQ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Examination of dimensionality of multilayer perceptron estimating dislocation regions in multicrystalline silicon photoluminescence image |
Sub Title (in English) |
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Keyword(1) |
multicrystalline silicon |
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photoluminescence image |
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dislocation |
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multilayer perceptron |
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1st Author's Name |
Hiroaki Kudo |
1st Author's Affiliation |
Nagoya University (Nagoya Univ.) |
2nd Author's Name |
Tetsuya Matsumoto |
2nd Author's Affiliation |
Nagoya University (Nagoya Univ.) |
3rd Author's Name |
Kentaro Kutsukake |
3rd Author's Affiliation |
RIKEN (RIKEN) |
4th Author's Name |
Noritaka Usami |
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Nagoya University (Nagoya Univ.) |
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Speaker |
Author-1 |
Date Time |
2018-10-19 15:05:00 |
Presentation Time |
25 minutes |
Registration for |
IMQ |
Paper # |
IMQ2018-14 |
Volume (vol) |
vol.118 |
Number (no) |
no.256 |
Page |
pp.19-24 |
#Pages |
6 |
Date of Issue |
2018-10-12 (IMQ) |