Paper Abstract and Keywords |
Presentation |
2018-08-23 15:55
[Invited Talk]
Highly reliable memory system realizing long-term preservation of digital data
-- The background, issues and the prospects -- Toshio Kobayashi (SIT) R2018-23 EMD2018-26 CPM2018-26 OPE2018-53 LQE2018-42 Link to ES Tech. Rep. Archives: EMD2018-26 CPM2018-26 OPE2018-53 LQE2018-42 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Digital technology based on semiconductor technology has become indispensable technology for personal living and social activities by its overwhelming convenience and ability. On the other hand, it is known that in order to long-term preservation of digital data is a necessary ongoing financial strategy and the will to persist. If one of them is lost, there is impossible to preserve an information in the future, unlike paper media. Information that does not produce value in the short term, contents, even those that will become important to humanity in the future will be lost. Such a situation is called as the digital dark ages. As a first step to get the solution of this problem, researches on "Highly reliable long-term semiconductor memory system" are underway. There are many issues, however there is a potentially very huge business of the storage for long-term preservation. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Long-term preservation / Semiconductor / Non-volatile memory / Wiring / Emulation / Migration / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 185, R2018-23, pp. 31-36, Aug. 2018. |
Paper # |
R2018-23 |
Date of Issue |
2018-08-16 (R, EMD, CPM, OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
R2018-23 EMD2018-26 CPM2018-26 OPE2018-53 LQE2018-42 Link to ES Tech. Rep. Archives: EMD2018-26 CPM2018-26 OPE2018-53 LQE2018-42 |
Conference Information |
Committee |
EMD LQE OPE CPM R |
Conference Date |
2018-08-23 - 2018-08-24 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Otaru Camber of Commerce & Industry |
Topics (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
R |
Conference Code |
2018-08-EMD-LQE-OPE-CPM-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Highly reliable memory system realizing long-term preservation of digital data |
Sub Title (in English) |
The background, issues and the prospects |
Keyword(1) |
Long-term preservation |
Keyword(2) |
Semiconductor |
Keyword(3) |
Non-volatile memory |
Keyword(4) |
Wiring |
Keyword(5) |
Emulation |
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Migration |
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1st Author's Name |
Toshio Kobayashi |
1st Author's Affiliation |
Shibaura Institute of Technology (SIT) |
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Speaker |
Author-1 |
Date Time |
2018-08-23 15:55:00 |
Presentation Time |
45 minutes |
Registration for |
R |
Paper # |
R2018-23, EMD2018-26, CPM2018-26, OPE2018-53, LQE2018-42 |
Volume (vol) |
vol.118 |
Number (no) |
no.185(R), no.186(EMD), no.187(CPM), no.188(OPE), no.189(LQE) |
Page |
pp.31-36 |
#Pages |
6 |
Date of Issue |
2018-08-16 (R, EMD, CPM, OPE, LQE) |
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