Conference Information |
Committee |
EMCJ IEE-SPC EMD PEM |
Conference Date |
2018-07-26 - 2018-07-26 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
PEM |
Conference Code |
2018-07-EMCJ-SPC-EMD-PEM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
ESD evaluation using Optical E-Field Sensor/Optical Voltage Sensor |
Sub Title (in English) |
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Keyword(1) |
Optical E-field Sensor |
Keyword(2) |
Optical Voltage proe |
Keyword(3) |
IEC 16000-4-2 |
Keyword(4) |
ESD |
Keyword(5) |
malfunction |
Keyword(6) |
MZ type optical waveguide |
Keyword(7) |
Indirect discharge test method |
Keyword(8) |
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1st Author's Name |
Ryuji Osawa |
1st Author's Affiliation |
Seikoh Giken Co.,Ltd. (Seikoh Giken) |
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Speaker |
Author-1 |
Date Time |
2018-07-26 13:10:00 |
Presentation Time |
25 minutes |
Registration for |
PEM |
Paper # |
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Volume (vol) |
vol.118 |
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#Pages |
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