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Paper Abstract and Keywords
Presentation 2018-07-26 13:10
ESD evaluation using Optical E-Field Sensor/Optical Voltage Sensor
Ryuji Osawa (Seikoh Giken)   エレソ技報アーカイブはこちら
Abstract (in Japanese) (See Japanese page) 
(in English) For the immunity test by ESD (Electro-Static Discharge),the test method is internationally specified in IEC61000-4-2. Many instruments are classified as tolerance depending on the presence or absence of destruction or malfunction or the extent thereof depending on this standard or similar standards. For this ESD evaluation, we could obtain new findings by using Optical E-field Sensor and Optical Voltage Probe with MZ type optical waveguide. It is thought that this is suggesting a new use for sensing using optical waveguide, although it is just starting to study. In this presentation we will report on three applications among them. 1) Measurement of ESD electric field when the test ground is different.
2)Measurement of generated E-field distribution in indirect discharge test method. 3)Measurement of noise voltage signal causing robot malfunction.
Keyword (in Japanese) (See Japanese page) 
(in English) Optical E-field Sensor / Optical Voltage proe / IEC 16000-4-2 / ESD / malfunction / MZ type optical waveguide / Indirect discharge test method /  
Reference Info. IEICE Tech. Rep.
Paper #  
Date of Issue  
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Conference Information
Conference Date 2018-07-26 - 2018-07-26 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To PEM 
Conference Code 2018-07-EMCJ-SPC-EMD-PEM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) ESD evaluation using Optical E-Field Sensor/Optical Voltage Sensor 
Sub Title (in English)  
Keyword(1) Optical E-field Sensor  
Keyword(2) Optical Voltage proe  
Keyword(3) IEC 16000-4-2  
Keyword(4) ESD  
Keyword(5) malfunction  
Keyword(6) MZ type optical waveguide  
Keyword(7) Indirect discharge test method  
1st Author's Name Ryuji Osawa  
1st Author's Affiliation Seikoh Giken Co.,Ltd. (Seikoh Giken)
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Date Time 2018-07-26 13:10:00 
Presentation Time 25 
Registration for PEM 
Paper #  
Volume (vol) IEICE-118 
Number (no)  
#Pages IEICE- 
Date of Issue  

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