Paper Abstract and Keywords |
Presentation |
2018-05-14 14:50
Identification of Emitters of a Same Product
-- Applying Allan Deviation Analysis to Specific Emitter Identification -- Takashi Iwamoto (Mitsubishi Electric) SANE2018-9 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Specific Emitter Identification technologies collect growing attention aiming at transmitter-dependent reaction or prevention of spoofing. There have been many proposals of discriminators that identify emitters based on features extracted from pre-collected wave forms. Those methods are confronted by a difficulty that features need to cover possible changes in waveforms including ones caused by changes in base-band signals as well as changes in power levels of emission or exchange of amplifiers. In this paper, an identification method based on a fluctuation represented by an Allan deviation of an oscillator that governs a specific emitter is investigated. Though limited in number, experiments on samples of waves emitted by two emitters of a same product spaced apart over 60 dB in power levels show identities of emitters common to power levels over dispersions of respective emitters. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Allan deviation analysis / Allan variance / Specific Emitter Identification / discriminator / Software Defined Radio / crystal oscillator / random-walk / flicker modulation |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 28, SANE2018-9, pp. 47-50, May 2018. |
Paper # |
SANE2018-9 |
Date of Issue |
2018-05-07 (SANE) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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SANE2018-9 |
Conference Information |
Committee |
SANE |
Conference Date |
2018-05-14 - 2018-05-14 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Radar, EW and general |
Paper Information |
Registration To |
SANE |
Conference Code |
2018-05-SANE |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Identification of Emitters of a Same Product |
Sub Title (in English) |
Applying Allan Deviation Analysis to Specific Emitter Identification |
Keyword(1) |
Allan deviation analysis |
Keyword(2) |
Allan variance |
Keyword(3) |
Specific Emitter Identification |
Keyword(4) |
discriminator |
Keyword(5) |
Software Defined Radio |
Keyword(6) |
crystal oscillator |
Keyword(7) |
random-walk |
Keyword(8) |
flicker modulation |
1st Author's Name |
Takashi Iwamoto |
1st Author's Affiliation |
Mitsubishi Electric Corporation (Mitsubishi Electric) |
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Speaker |
Author-1 |
Date Time |
2018-05-14 14:50:00 |
Presentation Time |
25 minutes |
Registration for |
SANE |
Paper # |
SANE2018-9 |
Volume (vol) |
vol.118 |
Number (no) |
no.28 |
Page |
pp.47-50 |
#Pages |
4 |
Date of Issue |
2018-05-07 (SANE) |