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Paper Abstract and Keywords
Presentation 2018-04-13 11:35
Optical 3D Nano Artifact-metrics using White Light Interferometry
Naoki Yoshida (YNU), Yosuke Ueba, Shumpei Nishio, Yasuyuki Ohyagi (DNP), Morihisa Hoga (Compass21), Naoya Tate (KU), Makoto Naruse (NICT), Tsutomu Matsumoto (YNU) HWS2018-3
Abstract (in Japanese) (See Japanese page) 
(in English) We propose an artificial-metric system which authenticates nanostructures with random irregularities by means of an interference fringe image captured by a white light interferometer.
Keyword (in Japanese) (See Japanese page) 
(in English) Nano-artifact metrics / White light interferometer / Interference image / Security / Identity Management / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 3, HWS2018-3, pp. 11-16, April 2018.
Paper # HWS2018-3 
Date of Issue 2018-04-06 (HWS) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee HWS  
Conference Date 2018-04-13 - 2018-04-13 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To HWS 
Conference Code 2018-04-HWS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Optical 3D Nano Artifact-metrics using White Light Interferometry 
Sub Title (in English)  
Keyword(1) Nano-artifact metrics  
Keyword(2) White light interferometer  
Keyword(3) Interference image  
Keyword(4) Security  
Keyword(5) Identity Management  
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1st Author's Name Naoki Yoshida  
1st Author's Affiliation Yokohama National University (YNU)
2nd Author's Name Yosuke Ueba  
2nd Author's Affiliation Dai Nippon Printing Co., Ltd. (DNP)
3rd Author's Name Shumpei Nishio  
3rd Author's Affiliation Dai Nippon Printing Co., Ltd. (DNP)
4th Author's Name Yasuyuki Ohyagi  
4th Author's Affiliation Dai Nippon Printing Co., Ltd. (DNP)
5th Author's Name Morihisa Hoga  
5th Author's Affiliation Compass21 (Compass21)
6th Author's Name Naoya Tate  
6th Author's Affiliation Kyushu University (KU)
7th Author's Name Makoto Naruse  
7th Author's Affiliation National Institute of Information and Communications Technology (NICT)
8th Author's Name Tsutomu Matsumoto  
8th Author's Affiliation Yokohama National University (YNU)
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Speaker
Date Time 2018-04-13 11:35:00 
Presentation Time 25 
Registration for HWS 
Paper # IEICE-HWS2018-3 
Volume (vol) IEICE-118 
Number (no) no.3 
Page pp.11-16 
#Pages IEICE-6 
Date of Issue IEICE-HWS-2018-04-06 


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