Paper Abstract and Keywords |
Presentation |
2018-04-13 15:25
A Compact Countermeasure against Laser-Fault-Injection Attack Utilizing Bulk-Current Sensor and Instantaneous Supply-Shunt Circuit Kohei Matsuda (Kobe Univ.), Tatsuya Fujii, Shoji Natsu, Takeshi Sugawara, Kazuo Sakiyama (UCE), Yu-ichi Hayashi (NAIST), Makoto Nagata, Noriyuki Miura (Kobe Univ.) HWS2018-8 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
A compact sense-and-reacts countermeasure is proposed against laser fault injection attack on cryptographic processors. A distributed bulk-current sensor detects laser irradiation on flip-flop in cryptographic cores by monitoring abnormal transient bulk current. After the attack detection, the cryptographic core supply is immediately cut off for erasing internal faulty data. A protected AES core in 0.18$mu$m can disable a laser fault injection attack with only +28% layout area penalty compared with unprotected AES core. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Hardware Security / Laser Fault Injection Attack / AES / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 3, HWS2018-8, pp. 41-44, April 2018. |
Paper # |
HWS2018-8 |
Date of Issue |
2018-04-06 (HWS) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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HWS2018-8 |
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