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Paper Abstract and Keywords
Presentation 2018-03-01 15:55
A Study on Conductor Loss Measurement of Microstrip Line
Yusuke Kusama, Yusuke Yokoi (Kagawa NCT) MW2017-187 ICD2017-111 Link to ES Tech. Rep. Archives: MW2017-187 ICD2017-111
Abstract (in Japanese) (See Japanese page) 
(in English) Many studies on the conductor loss of the copper-clad dielectric substrate have already been reported, and a method of obtaining frequency characteristics of the conductivity from the measured value by applying the concept of effective conductivity is adopted. In this report, the decrease rate of the signal line cross-sectional area due to the skin effect is estimated from the transmission characteristic measurement according to the physical law that the cross-sectional area of the signal line decreases due to the skin effect instead of the conductivity frequency characteristic.
Keyword (in Japanese) (See Japanese page) 
(in English) Microwave Circuit / Microstrip / Conductor loss / Skin effect / Education / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 462, MW2017-187, pp. 59-64, March 2018.
Paper # MW2017-187 
Date of Issue 2018-02-22 (MW, ICD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MW2017-187 ICD2017-111 Link to ES Tech. Rep. Archives: MW2017-187 ICD2017-111

Conference Information
Committee ICD MW  
Conference Date 2018-03-01 - 2018-03-02 
Place (in Japanese) (See Japanese page) 
Place (in English) The University of Shiga Prefecture 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Microwave Integrated Circuit/Microwave Technologies 
Paper Information
Registration To MW 
Conference Code 2018-03-ICD-MW 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on Conductor Loss Measurement of Microstrip Line 
Sub Title (in English)  
Keyword(1) Microwave Circuit  
Keyword(2) Microstrip  
Keyword(3) Conductor loss  
Keyword(4) Skin effect  
Keyword(5) Education  
1st Author's Name Yusuke Kusama  
1st Author's Affiliation National Institute of Technology, Kagawa College (Kagawa NCT)
2nd Author's Name Yusuke Yokoi  
2nd Author's Affiliation National Institute of Technology, Kagawa College (Kagawa NCT)
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Date Time 2018-03-01 15:55:00 
Presentation Time 25 
Registration for MW 
Paper # IEICE-MW2017-187,IEICE-ICD2017-111 
Volume (vol) IEICE-117 
Number (no) no.462(MW), no.463(ICD) 
Page pp.59-64 
#Pages IEICE-6 
Date of Issue IEICE-MW-2018-02-22,IEICE-ICD-2018-02-22 

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