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| Presentation | 2018-03-01 15:15 [Poster Presentation] A Study of Impedance Mismatch for S-parameter Measurement using Network Analyzer Takuichi Hirano (Tokyo Tech)  MW2017-185 ICD2017-109 Link to ES Tech. Rep. Archives: MW2017-185 ICD2017-109 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | S parameters of high frequency circuits are measured by a network analyzer. Calibration is performed before measurement using the network analyzer in order to remove influences of secular change, temperature, moisture, etc. in the internal circuit and connected cables. Reference planes are determined by calibration. S parameters are calculated using waves passing through the reference planes. There are several methods in calibration such as the method using Open/Short/Load(Match)/Thru, which is referred to as SOLT or TOSM, the method using Thru/Reflect/Line, which is referred to as TRL, and the method called electronic calibration (ECal) which does not require replacement of calibration kits. Sometimes ripples are observed in S parameters of simple circuit although the influence of internal circuit and cables are removed by calibration. The cause of ripples is difficult to identify. A consideration on the cause of ripples will be presented and discussed. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Network Analyzer / S parameters / Measurement / Calibration / Ripple / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 117, no. 462, MW2017-185, pp. 55-55, March 2018. | |
| Paper # | MW2017-185 | |
| Date of Issue | 2018-02-22 (MW, ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2017-185 ICD2017-109 Link to ES Tech. Rep. Archives: MW2017-185 ICD2017-109 |
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| Conference Information | |
| Committee | ICD MW |
| Conference Date | 2018-03-01 - 2018-03-02 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | The University of Shiga Prefecture |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Integrated Circuit/Microwave Technologies |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2018-03-ICD-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Study of Impedance Mismatch for S-parameter Measurement using Network Analyzer |
| Sub Title (in English) | |
| Keyword(1) | Network Analyzer |
| Keyword(2) | S parameters |
| Keyword(3) | Measurement |
| Keyword(4) | Calibration |
| Keyword(5) | Ripple |
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| 1st Author's Name | Takuichi Hirano |
| 1st Author's Affiliation | Tokyo Institute of Technology (Tokyo Tech) |
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| Speaker | Author-1 |
| Date Time | 2018-03-01 15:15:00 |
| Presentation Time | 5 minutes |
| Registration for | MW |
| Paper # | MW2017-185, ICD2017-109 |
| Volume (vol) | vol.117 |
| Number (no) | no.462(MW), no.463(ICD) |
| Page | p.55 |
| #Pages | 1 |
| Date of Issue | 2018-02-22 (MW, ICD) |
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