Paper Abstract and Keywords |
Presentation |
2018-02-28 14:40
Construction of Seebeck coefficient evaluation technique by Kelvin-probe force microscopy Yuhei Suzuki, Akito Oka, Taketo Kawai, Hirokazu Tatsuoka, Hiroshi Inokawa, Masaru Shimomura, Kenji Murakami (Shizuoka Univ.), Faiz Salleh (Univ. of Malaya), Hiroya Ikeda (Shizuoka Univ.) ED2017-110 SDM2017-110 Link to ES Tech. Rep. Archives: ED2017-110 SDM2017-110 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Although the introduction of nanostructures into thermoelectric materials is one of key technology for enhancement in thermoelectric conversion efficiency, a technique for characterizing the nanometer-scale material is required. With the aim of evaluating Seebeck coefficient of nanostructured thermoelectric materials, we propose a new technique by Kelvin-probe force microscopy (KFM) which gives us local surface potential corresponding to the Fermi energy difference of a sample relative to the cantilever. Hence, thermoelectromotive force and temperature difference are obtained from the surface potentials and temperatures at the high- and low-temperature regions on the sample, which leads to evaluation of Seebeck coefficient. In this study, the Seebeck coefficient of Si-on-insulator (SOI) layer is evaluated by KFM. In addition, the measurement technique of local temperature by KFM is also described. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
thermoelectrics / nanostructure / Seebeck coefficient / Kelvin-probe force microscopy (KFM) / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 117, no. 454, SDM2017-110, pp. 27-30, Feb. 2018. |
Paper # |
SDM2017-110 |
Date of Issue |
2018-02-21 (ED, SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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ED2017-110 SDM2017-110 Link to ES Tech. Rep. Archives: ED2017-110 SDM2017-110 |
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