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| Presentation | 2018-02-20 09:30 Note on Weighted Fault Coverage for Two-Pattern Tests Masayuki Arai (Nihon Univ.), Kazuhiko Iwasaki (Tokyo Metro. Univ.)  DC2017-77 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | hrinking feature size and higher integration on semiconductor device manufacturing technology bring a problem of the gap between the defect level estimated at the design stage from the reported one for fabricated devices. As one possible strategy to accurately estimate the defect level, authors have proposed weighted bridge/open fault coverage estimation, as well as test generation algorithms based on the weighted fault coverage. Previous work has only taken static fault models into account. In this study we introduce a fault model considering static and dynamic behavior of a defect, assuming that a part of behavior of a defect can only be observed as rise/fall delay. Targeting test pattern sets consisting of 2-pattern tests, we calculate weighted bridge/open fault coverage, and compare with conventional fault coverages based on delay and static fault models. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | weighted fault coverage / critical area / bridge fault / open fault / delay fault / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 117, no. 444, DC2017-77, pp. 1-6, Feb. 2018. | |
| Paper # | DC2017-77 | |
| Date of Issue | 2018-02-13 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2017-77 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2018-02-20 - 2018-02-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2018-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Note on Weighted Fault Coverage for Two-Pattern Tests |
| Sub Title (in English) | |
| Keyword(1) | weighted fault coverage |
| Keyword(2) | critical area |
| Keyword(3) | bridge fault |
| Keyword(4) | open fault |
| Keyword(5) | delay fault |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Masayuki Arai |
| 1st Author's Affiliation | Nihon University (Nihon Univ.) |
| 2nd Author's Name | Kazuhiko Iwasaki |
| 2nd Author's Affiliation | Tokyo Metropolitan University (Tokyo Metro. Univ.) |
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| Speaker | Author-1 |
| Date Time | 2018-02-20 09:30:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2017-77 |
| Volume (vol) | vol.117 |
| Number (no) | no.444 |
| Page | pp.1-6 |
| #Pages | 6 |
| Date of Issue | 2018-02-13 (DC) |
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