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Paper Abstract and Keywords
Presentation 2018-02-20 15:05
A method for improving an estimation accuracy of a specific temperature and voltage range in a digital temperature and voltage sensor
Kenji Inoue, Yousuke Miyake, Seiji Kajihara (Kyutech) DC2017-85
Abstract (in Japanese) (See Japanese page) 
(in English) An RO(Ring Oscillator)-based digital temperature and voltage sensor has been proposed in order to measure an on-chip temperature and voltage during VLSI operation. The sensor is used to dynamically optimize the chip performance with voltage and frequency scaling, or to judge whether an on-chip temperature is exceeded an upper limit of the temperature. Thus, it is necessary to guarantee a high accuracy in the specific temperature or voltage range including a target value near the limit of the temperature. This paper proposes a method for improving an estimation accuracy of a specific temperature and voltage range for a digital temperature and voltage sensor. The proposed method can derive a high accuracy estimation equation in the specific temperature and voltage by determining a division width according to the target range.
Keyword (in Japanese) (See Japanese page) 
(in English) Temperature Sensor / Voltage Sensor / Ring Oscillator / Field test / Fully digital design / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 444, DC2017-85, pp. 49-54, Feb. 2018.
Paper # DC2017-85 
Date of Issue 2018-02-13 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (No. 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2018-02-20 - 2018-02-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2018-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A method for improving an estimation accuracy of a specific temperature and voltage range in a digital temperature and voltage sensor 
Sub Title (in English)  
Keyword(1) Temperature Sensor  
Keyword(2) Voltage Sensor  
Keyword(3) Ring Oscillator  
Keyword(4) Field test  
Keyword(5) Fully digital design  
1st Author's Name Kenji Inoue  
1st Author's Affiliation kyushu Institute of Technology (Kyutech)
2nd Author's Name Yousuke Miyake  
2nd Author's Affiliation kyushu Institute of Technology (Kyutech)
3rd Author's Name Seiji Kajihara  
3rd Author's Affiliation kyushu Institute of Technology (Kyutech)
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Date Time 2018-02-20 15:05:00 
Presentation Time 25 
Registration for DC 
Paper # IEICE-DC2017-85 
Volume (vol) IEICE-117 
Number (no) no.444 
Page pp.49-54 
#Pages IEICE-6 
Date of Issue IEICE-DC-2018-02-13 

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