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Paper Abstract and Keywords
Presentation 2018-01-30 13:35
Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation
Hiroshi Nakao, Yu Yonezawa, Yoshiyasu Nakashima (Fujitsu LAB), Fujio Kurokawa (NiAS) EE2017-71
Abstract (in Japanese) (See Japanese page) 
(in English) Electrolytic capacitors are known as one of the highest failure rate components in switching mode power supply SMPS). We found low stability phenomenon of digitally controlled SMPS caused by capacitor equivalent serial resistance (ESR) degradation. This low stability phenomenon is digitally control oriented and suitable for degradation detection or failure prediction of electrolytic capacitor.
Keyword (in Japanese) (See Japanese page) 
(in English) Digitally controlled SMPS / Electrolytic capacitor / degradation detection / failure prediction / low stability phenomenon / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 424, EE2017-71, pp. 165-170, Jan. 2018.
Paper # EE2017-71 
Date of Issue 2018-01-22 (EE) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EE  
Conference Date 2018-01-29 - 2018-01-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Satellite Campus Oita 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EE 
Conference Code 2018-01-EE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation 
Sub Title (in English)  
Keyword(1) Digitally controlled SMPS  
Keyword(2) Electrolytic capacitor  
Keyword(3) degradation detection  
Keyword(4) failure prediction  
Keyword(5) low stability phenomenon  
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1st Author's Name Hiroshi Nakao  
1st Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu LAB)
2nd Author's Name Yu Yonezawa  
2nd Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu LAB)
3rd Author's Name Yoshiyasu Nakashima  
3rd Author's Affiliation Fujitsu Laboratories LTD. (Fujitsu LAB)
4th Author's Name Fujio Kurokawa  
4th Author's Affiliation The Nagasaki Institute of Applied Science (NiAS)
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Speaker
Date Time 2018-01-30 13:35:00 
Presentation Time 30 
Registration for EE 
Paper # IEICE-EE2017-71 
Volume (vol) IEICE-117 
Number (no) no.424 
Page pp.165-170 
#Pages IEICE-6 
Date of Issue IEICE-EE-2018-01-22 


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