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Paper Abstract and Keywords
Presentation 2018-01-30 11:00
[Invited Talk] Perspective of Negative Capacitance FinFETs Investigated by Transient TCAD Simulation
Hiroyuki Ota, Shinji Mgita, Tsutomu Ikegami, Junichi Hattori, Hidehiro Asai, Koichi Fukuda (AIST), Akira Toriumi (The Univ. of Tokyo) SDM2017-91 Link to ES Tech. Rep. Archives: SDM2017-91
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(in English) (Not available yet)
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Reference Info. IEICE Tech. Rep., vol. 117, no. 427, SDM2017-91, pp. 1-4, Jan. 2018.
Paper # SDM2017-91 
Date of Issue 2018-01-23 (SDM) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee SDM  
Conference Date 2018-01-30 - 2018-01-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To SDM 
Conference Code 2018-01-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Perspective of Negative Capacitance FinFETs Investigated by Transient TCAD Simulation 
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1st Author's Name Hiroyuki Ota  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
2nd Author's Name Shinji Mgita  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Tsutomu Ikegami  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Junichi Hattori  
4th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name Hidehiro Asai  
5th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name Koichi Fukuda  
6th Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST)
7th Author's Name Akira Toriumi  
7th Author's Affiliation The University of Tokyo (The Univ. of Tokyo)
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Speaker
Date Time 2018-01-30 11:00:00 
Presentation Time 30 
Registration for SDM 
Paper # IEICE-SDM2017-91 
Volume (vol) IEICE-117 
Number (no) no.427 
Page pp.1-4 
#Pages IEICE-4 
Date of Issue IEICE-SDM-2018-01-23 


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