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Paper Abstract and Keywords
Presentation 2018-01-18 13:50
Examination of the Normally-off using the stack circuit
Kenji Sakamura (OPUGS), Kazutami Arimoto, Isao Kayano, Tomoyuki Yokogawa (OPU)
Abstract (in Japanese) (See Japanese page) 
(in English) In the stack circuit using charge recycling, low consumption electricity such as the streaming processing movement is effective for becoming it. On the other hand, the Normally-off is a technique to zero the consumption electricity at the time of the wait. I put these two techniques together and report the examination result about the control system of the Normally-off with the stack circuit for battery drive systems.
Keyword (in Japanese) (See Japanese page) 
(in English) Normally-off computing / Stack circuit / Super capacitor / / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 377, VLD2017-70, pp. 49-51, Jan. 2018.
Paper # VLD2017-70 
Date of Issue 2018-01-11 (VLD, CPSY, RECONF) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380

Conference Information
Conference Date 2018-01-18 - 2018-01-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Raiosha, Hiyoshi Campus, Keio University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) FPGA Applications, etc 
Paper Information
Registration To VLD 
Conference Code 2018-01-ARC-VLD-CPSY-RECONF-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Examination of the Normally-off using the stack circuit 
Sub Title (in English)  
Keyword(1) Normally-off computing  
Keyword(2) Stack circuit  
Keyword(3) Super capacitor  
1st Author's Name Kenji Sakamura  
1st Author's Affiliation Okayama Prefectural University (OPUGS)
2nd Author's Name Kazutami Arimoto  
2nd Author's Affiliation Okayama Prefectural University (OPU)
3rd Author's Name Isao Kayano  
3rd Author's Affiliation Okayama Prefectural University (OPU)
4th Author's Name Tomoyuki Yokogawa  
4th Author's Affiliation Okayama Prefectural University (OPU)
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Date Time 2018-01-18 13:50:00 
Presentation Time 25 
Registration for VLD 
Paper # IEICE-VLD2017-70,IEICE-CPSY2017-114,IEICE-RECONF2017-58 
Volume (vol) IEICE-117 
Number (no) no.377(VLD), no.378(CPSY), no.379(RECONF) 
Page pp.49-51 
#Pages IEICE-3 
Date of Issue IEICE-VLD-2018-01-11,IEICE-CPSY-2018-01-11,IEICE-RECONF-2018-01-11 

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