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Paper Abstract and Keywords
Presentation 2017-11-10 13:00
[Poster Presentation] Binary Classification from Positive-Confidence Data
Takashi Ishida (SMAM/UTokyo/RIKEN), Gang Niu (UTokyo/RIKEN), Masashi Sugiyama (RIKEN/UTokyo) IBISML2017-62
Abstract (in Japanese) (See Japanese page) 
(in English) Reducing labeling costs in supervised learning is a critical issue in many practical machine learning applications. In this paper, we consider positive-confidence (Pconf) classification, the problem of training a binary classifier only from positive data equipped with confidence. Pconf classification can be regarded as a discriminative extension of one-class classification (which is aimed at ``describing'' the positive class), with ability to tune hyper-parameters for ``classifying'' positive and negative samples. Pconf classification is also related to positive-unlabeled (PU) classification (which uses hard-labeled positive data and unlabeled data), allowing us to avoid estimating the class priors, which is a critical bottleneck in typical PU classification methods. For the Pconf classification problem, we provide a simple empirical risk minimization framework and give a formulation for linear-in-parameter models that can be implemented easily and computationally efficiently. We also theoretically establish the consistency and generalization error bounds for Pconf classification, and demonstrate the practical usefulness of the proposed method through experiments.
Keyword (in Japanese) (See Japanese page) 
(in English) pconf / positive-confidence / weakly-supervised learning / / / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 293, IBISML2017-62, pp. 207-214, Nov. 2017.
Paper # IBISML2017-62 
Date of Issue 2017-11-02 (IBISML) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee IBISML  
Conference Date 2017-11-08 - 2017-11-10 
Place (in Japanese) (See Japanese page) 
Place (in English) Univ. of Tokyo 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Information-Based Induction Science Workshop (IBIS2017) 
Paper Information
Registration To IBISML 
Conference Code 2017-11-IBISML 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Binary Classification from Positive-Confidence Data 
Sub Title (in English)  
Keyword(1) pconf  
Keyword(2) positive-confidence  
Keyword(3) weakly-supervised learning  
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1st Author's Name Takashi Ishida  
1st Author's Affiliation Sumitomo Mitsui Asset Management/The University of Tokyo/RIKEN (SMAM/UTokyo/RIKEN)
2nd Author's Name Gang Niu  
2nd Author's Affiliation The University of Tokyo/RIKEN (UTokyo/RIKEN)
3rd Author's Name Masashi Sugiyama  
3rd Author's Affiliation RIKEN/The University of Tokyo (RIKEN/UTokyo)
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Speaker Author-1 
Date Time 2017-11-10 13:00:00 
Presentation Time 150 minutes 
Registration for IBISML 
Paper # IBISML2017-62 
Volume (vol) vol.117 
Number (no) no.293 
Page pp.207-214 
#Pages
Date of Issue 2017-11-02 (IBISML) 


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