講演抄録/キーワード |
講演名 |
2017-11-07 09:25
On Avoiding Test Data Corruption by Optimal Scan Chain Grouping ○Yucong Zhang・Stefan Holst・Xiaoqing Wen・Kohei Miyase・Seiji Kajihara(KIT)・Jun Qian(AMD) VLD2017-42 DC2017-48 |
抄録 |
(和) |
(まだ登録されていません) |
(英) |
Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting the states of some scan flip-flops and thus corrupting test stimuli or test responses. A widely-adopted approach to solving this problem is to design multiple scan chains and shift only a group of of them at a time. This paper presents a novel scan chain grouping algorithm for reducing the probability of test data corruption caused by excessive instantaneous IR-drop on scan flip-flops. Experimental results show significant improvement of shift-power safety on all large ITC’99 benchmark circuits. |
キーワード |
(和) |
/ / / / / / / |
(英) |
scan test / shift power / LSI test / DFT / IR-drop / scan chain grouping / test data corruption / test power |
文献情報 |
信学技報, vol. 117, no. 274, DC2017-48, pp. 91-94, 2017年11月. |
資料番号 |
DC2017-48 |
発行日 |
2017-10-30 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
VLD2017-42 DC2017-48 |
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