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Paper Abstract and Keywords
Presentation 2017-08-31 14:20
Suppression of SS-OCT thickness Measurement Value Drift by Adaptation to Central Wavelength Shift of Sweep Range
Masahiro Ueno, Takashi Sakamoto, Seiji Toyoda, Yuzo Sasaki, Joji Yamaguchi, Tadashi Sakamoto (NTT), Masatoshi Fujimoto, Mahiro Yamada (Hamamatsu Photonics K. K.), Eiichi Sugai, Toru Kodaira (NTT-AT) R2017-26 EMD2017-20 CPM2017-41 OPE2017-50 LQE2017-23 Link to ES Tech. Rep. Archives: EMD2017-20 CPM2017-41 OPE2017-50 LQE2017-23
Abstract (in Japanese) (See Japanese page) 
(in English) Swept source optical coherence tomography (SS-OCT) is a technique to capture tomographic images of moving objects at high speed with high resolution of several 10 µm level. In thickness measurement using SS-OCT technique, the light reflected when the swept light is irradiated to the observation target is used. If the central wavelength of the sweep range fluctuates due to some influence, the optical path length within the observation target fluctuates due to the refractive index chromatic dispersion of the target. Therefore, the fluctuation of the center wavelength affects the thickness measurement value. In this paper, we describe that fluctuation of thickness measurement value can be suppressed by performing signal processing adapted to wavelength fluctuation using the dispersion characteristics.
Keyword (in Japanese) (See Japanese page) 
(in English) Wavelength-dispersive refractive index / SS-OCT / Rescaling / Resampling / PSF / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 193, CPM2017-41, pp. 11-16, Aug. 2017.
Paper # CPM2017-41 
Date of Issue 2017-08-24 (R, EMD, CPM, OPE, LQE) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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Download PDF R2017-26 EMD2017-20 CPM2017-41 OPE2017-50 LQE2017-23 Link to ES Tech. Rep. Archives: EMD2017-20 CPM2017-41 OPE2017-50 LQE2017-23

Conference Information
Committee R EMD CPM LQE OPE  
Conference Date 2017-08-31 - 2017-09-01 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2017-08-R-EMD-CPM-LQE-OPE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Suppression of SS-OCT thickness Measurement Value Drift by Adaptation to Central Wavelength Shift of Sweep Range 
Sub Title (in English)  
Keyword(1) Wavelength-dispersive refractive index  
Keyword(2) SS-OCT  
Keyword(3) Rescaling  
Keyword(4) Resampling  
Keyword(5) PSF  
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Keyword(7)  
Keyword(8)  
1st Author's Name Masahiro Ueno  
1st Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
2nd Author's Name Takashi Sakamoto  
2nd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
3rd Author's Name Seiji Toyoda  
3rd Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
4th Author's Name Yuzo Sasaki  
4th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
5th Author's Name Joji Yamaguchi  
5th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
6th Author's Name Tadashi Sakamoto  
6th Author's Affiliation Nippon Telegraph and Telephone Corporation (NTT)
7th Author's Name Masatoshi Fujimoto  
7th Author's Affiliation Hamamatsu Photonics K. K. (Hamamatsu Photonics K. K.)
8th Author's Name Mahiro Yamada  
8th Author's Affiliation Hamamatsu Photonics K. K. (Hamamatsu Photonics K. K.)
9th Author's Name Eiichi Sugai  
9th Author's Affiliation NTT Advanced Technology Corporation (NTT-AT)
10th Author's Name Toru Kodaira  
10th Author's Affiliation NTT Advanced Technology Corporation (NTT-AT)
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Speaker
Date Time 2017-08-31 14:20:00 
Presentation Time 25 
Registration for CPM 
Paper # IEICE-R2017-26,IEICE-EMD2017-20,IEICE-CPM2017-41,IEICE-OPE2017-50,IEICE-LQE2017-23 
Volume (vol) IEICE-117 
Number (no) no.191(R), no.192(EMD), no.193(CPM), no.194(OPE), no.195(LQE) 
Page pp.11-16 
#Pages IEICE-6 
Date of Issue IEICE-R-2017-08-24,IEICE-EMD-2017-08-24,IEICE-CPM-2017-08-24,IEICE-OPE-2017-08-24,IEICE-LQE-2017-08-24 


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