Paper Abstract and Keywords |
Presentation |
2017-05-23 11:55
Investigation on the Effect of Error Correction by RS Code on Pattern Masking of Double Encoded Two-dimensional Code Nobuyuki Teraura (TCRI), Keiichi Iwamura (TUS), Isao Echizen (NII), Kouichi Sakurai (kyushu Univ.) IT2017-12 EMM2017-12 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The black cell of a two dimensional code is coded in normal black ink (infrared absorption) and special black ink (infrared transmission), and the double encoding which gives a secrecy data to a two dimensional code is considered.. As data to be double-coded, a data code word based on the RS code is used and an error correction function is implemented. As data to be double-coded, a data code word based on the RS code is used and an error correction function is implemented We report on the hard decision and the soft decision on the effect of the error correction function on the concealing by this pattern mask process.. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Double Encoding / Two-dimensional code / Concealing / RS Code / Error Correction / / / |
Reference Info. |
IEICE Tech. Rep., vol. 117, no. 40, EMM2017-12, pp. 67-72, May 2017. |
Paper # |
EMM2017-12 |
Date of Issue |
2017-05-15 (IT, EMM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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IT2017-12 EMM2017-12 |
Conference Information |
Committee |
EMM IT |
Conference Date |
2017-05-22 - 2017-05-23 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Yamagata University(Yonezawa Campus) |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Information Security, Information Theory, Information Hiding, etc. |
Paper Information |
Registration To |
EMM |
Conference Code |
2017-05-EMM-IT |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Investigation on the Effect of Error Correction by RS Code on Pattern Masking of Double Encoded Two-dimensional Code |
Sub Title (in English) |
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Keyword(1) |
Double Encoding |
Keyword(2) |
Two-dimensional code |
Keyword(3) |
Concealing |
Keyword(4) |
RS Code |
Keyword(5) |
Error Correction |
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1st Author's Name |
Nobuyuki Teraura |
1st Author's Affiliation |
Terrara Code Research Institute (TCRI) |
2nd Author's Name |
Keiichi Iwamura |
2nd Author's Affiliation |
Tokyo University of Science (TUS) |
3rd Author's Name |
Isao Echizen |
3rd Author's Affiliation |
National Institute of Informatics (NII) |
4th Author's Name |
Kouichi Sakurai |
4th Author's Affiliation |
Kyushu University (kyushu Univ.) |
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Speaker |
Author-1 |
Date Time |
2017-05-23 11:55:00 |
Presentation Time |
25 minutes |
Registration for |
EMM |
Paper # |
IT2017-12, EMM2017-12 |
Volume (vol) |
vol.117 |
Number (no) |
no.39(IT), no.40(EMM) |
Page |
pp.67-72 |
#Pages |
6 |
Date of Issue |
2017-05-15 (IT, EMM) |
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