Paper Abstract and Keywords |
Presentation |
2017-02-21 14:00
Impact of Operational Unit Binding on Aging-induced Degradation in High-level Synthesis for Asynchronous Systems Tsuyoshi Iwagaki, Kohta Itani, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2016-78 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper discusses delay-robustness of a four-phase dual-rail asynchronous system at register transfer level (RTL). A type of RTL delay faults, which can be caused by the stress during operations in the field and correspond to aging-induced degradation, is introduced to analyze delay-robustness of such a system. Since data transfer between registers is realized by the interaction between the controller and datapath of an asynchronous system, i.e., by handshaking, the effect of any delay fault never causes system failure but can lead to performance degradation of the system. In this paper, it is pointed out that operational unit binding in high-level synthesis for asynchronous systems affects their delay-robustness in terms of performance degradation through several design examples. The future direction of operational unit binding is also discussed to obtain asynchronous systems with high delay-robustness. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Four-phase dual-rail asynchronous system / Aging-induced degradation / RTL delay fault / Delay-robustness / Op- erational unit binding / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 466, DC2016-78, pp. 23-28, Feb. 2017. |
Paper # |
DC2016-78 |
Date of Issue |
2017-02-14 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2016-78 |
Conference Information |
Committee |
DC |
Conference Date |
2017-02-21 - 2017-02-21 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
VLSI Design and Test, etc |
Paper Information |
Registration To |
DC |
Conference Code |
2017-02-DC |
Language |
English |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Impact of Operational Unit Binding on Aging-induced Degradation in High-level Synthesis for Asynchronous Systems |
Sub Title (in English) |
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Keyword(1) |
Four-phase dual-rail asynchronous system |
Keyword(2) |
Aging-induced degradation |
Keyword(3) |
RTL delay fault |
Keyword(4) |
Delay-robustness |
Keyword(5) |
Op- erational unit binding |
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1st Author's Name |
Tsuyoshi Iwagaki |
1st Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
2nd Author's Name |
Kohta Itani |
2nd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
3rd Author's Name |
Hideyuki Ichihara |
3rd Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
4th Author's Name |
Tomoo Inoue |
4th Author's Affiliation |
Hiroshima City University (Hiroshima City Univ.) |
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Speaker |
Author-1 |
Date Time |
2017-02-21 14:00:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2016-78 |
Volume (vol) |
vol.116 |
Number (no) |
no.466 |
Page |
pp.23-28 |
#Pages |
6 |
Date of Issue |
2017-02-14 (DC) |
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