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Paper Abstract and Keywords
Presentation 2016-12-19 16:05
Design and fabrication of terahertz detectors based on 180 nm CMOS process technology
Kosuke Wakita, Masayuki Ikebe (Hokkaido Univ.), Stevanus Arnold, Taiichi Otsuji (Tohoku Univ.), Yuma Takida, Hiroaki Minamide (RIKEN), Eiichi Sano (Hokkaido Univ.) ED2016-83 Link to ES Tech. Rep. Archives: ED2016-83
Abstract (in Japanese) (See Japanese page) 
(in English) Use of terahertz waves for imaging is gaining increased interest. A CMOS cascode amplifier biased near the threshold voltage of a MOSFET for terahertz direct detection is proposed. A CMOS terahertz imaging pixel is designed and fabricated on the basis of a low-cost 180 nm CMOS process technology. The imaging pixel consists of a microstrip patch antenna, an impedance-matching circuit, and the direct detector. The imaging circuit occupies 250 × 180 um^2. It achieves a responsivity of 51.9 kV/W at 0.915 THz and a noise equivalent power (NEP) of 358 pW/Hz^1/2 at a modulation frequency of 31 Hz. The NEP is estimated to be reduced to 42 pW/Hz^1/2 at a higher modulation frequency of 100 kHz.
Keyword (in Japanese) (See Japanese page) 
(in English) Terahertz / THz / Imaging / CMOS / Detector / Responsivity / NEP /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 375, ED2016-83, pp. 17-22, Dec. 2016.
Paper # ED2016-83 
Date of Issue 2016-12-12 (ED) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2016-83 Link to ES Tech. Rep. Archives: ED2016-83

Conference Information
Committee ED  
Conference Date 2016-12-19 - 2016-12-20 
Place (in Japanese) (See Japanese page) 
Place (in English) RIEC, Tohoku Univ 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Millimeter-wave, terahertz-wave devices and systems 
Paper Information
Registration To ED 
Conference Code 2016-12-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Design and fabrication of terahertz detectors based on 180 nm CMOS process technology 
Sub Title (in English)  
Keyword(1) Terahertz  
Keyword(2) THz  
Keyword(3) Imaging  
Keyword(4) CMOS  
Keyword(5) Detector  
Keyword(6) Responsivity  
Keyword(7) NEP  
Keyword(8)  
1st Author's Name Kosuke Wakita  
1st Author's Affiliation Hokkaido University (Hokkaido Univ.)
2nd Author's Name Masayuki Ikebe  
2nd Author's Affiliation Hokkaido University (Hokkaido Univ.)
3rd Author's Name Stevanus Arnold  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Taiichi Otsuji  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Yuma Takida  
5th Author's Affiliation RIKEN Center for Advanced Photonics (RIKEN)
6th Author's Name Hiroaki Minamide  
6th Author's Affiliation RIKEN Center for Advanced Photonics (RIKEN)
7th Author's Name Eiichi Sano  
7th Author's Affiliation Hokkaido University (Hokkaido Univ.)
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Speaker Author-1 
Date Time 2016-12-19 16:05:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2016-83 
Volume (vol) vol.116 
Number (no) no.375 
Page pp.17-22 
#Pages
Date of Issue 2016-12-12 (ED) 


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