Paper Abstract and Keywords |
Presentation |
2016-12-15 15:30
[Poster Presentation]
Study of the capacitor ratio adjustment method that takes into account the parasitic capacitance of MOS switch in Capacitor-DAC Yoshiharu Miyake, Masahiro Sasaki (SIT) ICD2016-63 CPSY2016-69 Link to ES Tech. Rep. Archives: ICD2016-63 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In recent years, C-DAC (Capacitor Digital to Analog Converter) is often used as a reference voltage source in a successive approximation ADC (Analog to Digital Converter). In general, a C-DAC consists of a MOS switch and a group of capacitors with binary weighted capacitance values. However, the parasitic capacitance that causes an error in the capacitance ratio, and therefore it is necessary to readjust the capacitors’ value one by one from the simulation results. In this study, we analyze the relationship between the W/L ratio of the MOS switch and the capacitance ratio after the adjustment. And then by calculating the coefficient of the relationship, the comprehensive adjustment method of the C-DAC capacitance ratio that considers the parasitic component of the MOS switch will be examined. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
C-DAC / Parasitic capacitance / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 364, ICD2016-63, pp. 45-45, Dec. 2016. |
Paper # |
ICD2016-63 |
Date of Issue |
2016-12-08 (ICD, CPSY) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
ICD2016-63 CPSY2016-69 Link to ES Tech. Rep. Archives: ICD2016-63 |
Conference Information |
Committee |
ICD CPSY |
Conference Date |
2016-12-15 - 2016-12-16 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tokyo Institute of Technology |
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Registration To |
ICD |
Conference Code |
2016-12-ICD-CPSY |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
Title (in English) |
Study of the capacitor ratio adjustment method that takes into account the parasitic capacitance of MOS switch in Capacitor-DAC |
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C-DAC |
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Parasitic capacitance |
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1st Author's Name |
Yoshiharu Miyake |
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Shibaura Institute of Technology (SIT) |
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Masahiro Sasaki |
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Shibaura Institute of Technology (SIT) |
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Speaker |
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Date Time |
2016-12-15 15:30:00 |
Presentation Time |
120 minutes |
Registration for |
ICD |
Paper # |
ICD2016-63, CPSY2016-69 |
Volume (vol) |
vol.116 |
Number (no) |
no.364(ICD), no.365(CPSY) |
Page |
p.45 |
#Pages |
1 |
Date of Issue |
2016-12-08 (ICD, CPSY) |
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