IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-12-08 13:25
A study on dependence of decoding reliability on recording condition in SMR
Ryota Suzuto, Yasuaki Nakamura, Hisashi Osawa, Yoshihiro Okamoto (Ehime Univ.), Yasushi Kanai (Niigata Inst. Tech.), Hiroaki Muraoka (Tohoku Univ.) MR2016-31 Link to ES Tech. Rep. Archives: MR2016-31
Abstract (in Japanese) (See Japanese page) 
(in English) Shingled magnetic recording (SMR) is employed to realize higher recording densities in hard disk drive (HDD). In this report, we investigate the dependence of decoding reliability on recording condition by classifying the log-likelihood ratio (LLR) at a posteriori probability (APP) decoder output, according to the recording patterns. The results show that the decoding reliability for ``010'' is lowest on the decoding target track. Furthermore, the decoding reliability for ``011'' and ``011'' strongly depend on the recording condition of the decoding target bit and the recording pattern on the adjacent tracks.
Keyword (in Japanese) (See Japanese page) 
(in English) SMR / Recording condition / Decoding reliability / / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, Dec. 2016.
Paper #  
Date of Issue 2016-12-01 (MR) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF MR2016-31 Link to ES Tech. Rep. Archives: MR2016-31

Conference Information
Committee MRIS ITE-MMS  
Conference Date 2016-12-08 - 2016-12-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Ehime Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Signal Processing, etc. 
Paper Information
Registration To MRIS 
Conference Code 2016-12-MR-MMS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study on dependence of decoding reliability on recording condition in SMR 
Sub Title (in English)  
Keyword(1) SMR  
Keyword(2) Recording condition  
Keyword(3) Decoding reliability  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Ryota Suzuto  
1st Author's Affiliation Ehime University (Ehime Univ.)
2nd Author's Name Yasuaki Nakamura  
2nd Author's Affiliation Ehime University (Ehime Univ.)
3rd Author's Name Hisashi Osawa  
3rd Author's Affiliation Ehime University (Ehime Univ.)
4th Author's Name Yoshihiro Okamoto  
4th Author's Affiliation Ehime University (Ehime Univ.)
5th Author's Name Yasushi Kanai  
5th Author's Affiliation Niigata Institute of Technology (Niigata Inst. Tech.)
6th Author's Name Hiroaki Muraoka  
6th Author's Affiliation Tohoku University (Tohoku Univ.)
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2016-12-08 13:25:00 
Presentation Time 25 minutes 
Registration for MRIS 
Paper # MR2016-31 
Volume (vol) vol.116 
Number (no) no.348 
Page pp.5-9 
#Pages
Date of Issue 2016-12-01 (MR) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan