IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-11-30 11:45
Keypoint Detection based on Learning to Rank for Robust Image Matching under Resolution Variation
Satoshi Yoshikawa, Keisuke Kameyama (Univ. of Tsukuba) CPM2016-85 ICD2016-46 IE2016-80 Link to ES Tech. Rep. Archives: CPM2016-85 ICD2016-46
Abstract (in Japanese) (See Japanese page) 
(in English) The image matching by keypoint selection from images is used in various situations in computer vision.
Among them, Scale-Invariant Feature Transform (SIFT), has been widely used for the feature extraction.
However, when the resolutions of the matched
images differ, solving keypoint correspondences become
difficult. In this work, we propose a method to detect
keypoints that are robust to scale changes. Based on
RankSIFT by Li et al., Gaussian Scale Space (GSS) and
scale features of each feature point are used to estimate
their robustness against scaling.
In addition, we proposed the method that predict the stability of keypoints by regression, and compared with the previous method based on RankSIFT.
The proposed method proved to be effective in finding a small set of points that persist through scaling.
Keyword (in Japanese) (See Japanese page) 
(in English) Keypoint Detection / Image Matching / SIFT / / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 335, IE2016-80, pp. 45-50, Nov. 2016.
Paper # IE2016-80 
Date of Issue 2016-11-22 (CPM, ICD, IE) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2016-85 ICD2016-46 IE2016-80 Link to ES Tech. Rep. Archives: CPM2016-85 ICD2016-46

Conference Information
Conference Date 2016-11-28 - 2016-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Ritsumeikan University, Osaka Ibaraki Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2016 -New Field of VLSI Design- 
Paper Information
Registration To IE 
Conference Code 2016-11-VLD-DC-CPSY-RECONF-CPM-ICD-IE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Keypoint Detection based on Learning to Rank for Robust Image Matching under Resolution Variation 
Sub Title (in English)  
Keyword(1) Keypoint Detection  
Keyword(2) Image Matching  
Keyword(3) SIFT  
1st Author's Name Satoshi Yoshikawa  
1st Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
2nd Author's Name Keisuke Kameyama  
2nd Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Date Time 2016-11-30 11:45:00 
Presentation Time 25 
Registration for IE 
Paper # IEICE-CPM2016-85,IEICE-ICD2016-46,IEICE-IE2016-80 
Volume (vol) IEICE-116 
Number (no) no.333(CPM), no.334(ICD), no.335(IE) 
Page pp.45-50 
#Pages IEICE-6 
Date of Issue IEICE-CPM-2016-11-22,IEICE-ICD-2016-11-22,IEICE-IE-2016-11-22 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan