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Paper Abstract and Keywords
Presentation 2016-11-28 15:05
Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions
Masashi Hifumi, Shigehiro Umehara, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2016-51 DC2016-45
Abstract (in Japanese) (See Japanese page) 
(in English) We evaluate tolerance for soft errors of FFs on a 28/65 nm FDSOI. We fabricated three different layouts of non-redundant FFs with same circuit area and, carried out heavy-ion measurement. Radiation hardbess is
influenced by layout structures. Heavy ion irradiation reveals that the separated diffusion layout structure in 28 nm have 2x more cross section than shared diffusion one by the irradation of 40 MeV-cm2/mg ions. Flip-flops in 65 nm have almost equivalent cross sections at any energies. It is due to flucations of soft error tolerance caused by effects of layout structures of more scaled 28 nm node.
Keyword (in Japanese) (See Japanese page) 
(in English) Soft Error / Heavy Ion / FDSOI / Flip Flop / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 330, VLD2016-51, pp. 43-48, Nov. 2016.
Paper # VLD2016-51 
Date of Issue 2016-11-21 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2016-51 DC2016-45

Conference Information
Committee VLD DC CPSY RECONF CPM ICD IE  
Conference Date 2016-11-28 - 2016-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Ritsumeikan University, Osaka Ibaraki Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2016 -New Field of VLSI Design- 
Paper Information
Registration To VLD 
Conference Code 2016-11-VLD-DC-CPSY-RECONF-CPM-ICD-IE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions 
Sub Title (in English)  
Keyword(1) Soft Error  
Keyword(2) Heavy Ion  
Keyword(3) FDSOI  
Keyword(4) Flip Flop  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Masashi Hifumi  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
2nd Author's Name Shigehiro Umehara  
2nd Author's Affiliation Kyoto Institute of Technology (KIT)
3rd Author's Name Haruki Maruoka  
3rd Author's Affiliation Kyoto Institute of Technology (KIT)
4th Author's Name Jun Furuta  
4th Author's Affiliation Kyoto Institute of Technology (KIT)
5th Author's Name Kazutoshi Kobayashi  
5th Author's Affiliation Kyoto Institute of Technology (KIT)
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Speaker
Date Time 2016-11-28 15:05:00 
Presentation Time 25 
Registration for VLD 
Paper # IEICE-VLD2016-51,IEICE-DC2016-45 
Volume (vol) IEICE-116 
Number (no) no.330(VLD), no.331(DC) 
Page pp.43-48 
#Pages IEICE-6 
Date of Issue IEICE-VLD-2016-11-21,IEICE-DC-2016-11-21 


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