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Paper Abstract and Keywords
Presentation 2016-11-03 13:55
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 2 --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2016-52 Link to ES Tech. Rep. Archives: EMD2016-52
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have studied degradation phenomenon on electrical contacts under the influences of an external micro-oscillation.
They have developed a new micro-sliding mechanism ($MSM2$) which provides micro-sliding driven by a piezo-electric actuator and elastic hinges.
By the mechanism they obtain the experimental results on ``minimal sliding amplitudes'' to make electrical resistances fluctuate under some conditions.
In this paper, more realistic input function is applied by sinusoidal function.
Using minimal sliding amplitude (MSA), input forces and output displacements are estimated.
By Duhamel's integral and optimization method, additional dynamical parameter $T_s$ is evaluated.
Therefore, the waveforms on theoretical model are similar to the experimental results.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-sliding mechanism / minimal sliding amplitude / input waveform / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 283, EMD2016-52, pp. 11-16, Nov. 2016.
Paper # EMD2016-52 
Date of Issue 2016-10-27 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2016-52 Link to ES Tech. Rep. Archives: EMD2016-52

Conference Information
Committee EMD  
Conference Date 2016-11-03 - 2016-11-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Awaji Yumebutai International Conference Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session IS-EMD2016 
Paper Information
Registration To EMD 
Conference Code 2016-11-EMD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism 
Sub Title (in English) The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 2 
Keyword(1) electrical contact  
Keyword(2) micro-sliding mechanism  
Keyword(3) minimal sliding amplitude  
Keyword(4) input waveform  
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1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC)
3rd Author's Name Koichiro Sawa  
3rd Author's Affiliation Nippon Institute of Thechnology (NIT)
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Speaker Author-1 
Date Time 2016-11-03 13:55:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2016-52 
Volume (vol) vol.116 
Number (no) no.283 
Page pp.11-16 
#Pages
Date of Issue 2016-10-27 (EMD) 


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