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| Presentation | 2016-10-28 17:00 Stability of organic physically unclonable function for voltage fractuation. Kazunori Kuribara, Yohei Hori, Toshihiro Katashita (AIST), Kazuaki Kakita, Yasuhiro Tanaka (Ube Inds.), Manabu Yoshida (AIST)  OME2016-47 Link to ES Tech. Rep. Archives: OME2016-47 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We have investigated stability of novel security system. We fabricate organic ring oscillators (ROs) and consider them as core circuit of physically unclonable function (PUF). We generate unique numbers from variance of frequency of ROs and check their stability in various operation voltage as voltage fluctuation. In a result, our RO-PUF shows low error rate of 4.8$times10^{-5}$ at 2 V. And even at 2.2 V, the rate keeps less than 0.1. On the other hand, inter Hamming distance between two chips is calculated as 0.22 to 0.33 which is high enough compared with error rate. Therefore, it is suggested that our RO-PUF works stably with operation voltage of below 2V. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Organic transistor / Self-assembly / Low voltage / Flexible / Security / Physically unclonable function / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 281, OME2016-47, pp. 39-42, Oct. 2016. | |
| Paper # | OME2016-47 | |
| Date of Issue | 2016-10-21 (OME) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
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| Download PDF | OME2016-47 Link to ES Tech. Rep. Archives: OME2016-47 |
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| Conference Information | |
| Committee | OME |
| Conference Date | 2016-10-28 - 2016-10-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Organic device, Materials, General |
| Paper Information | |
| Registration To | OME |
| Conference Code | 2016-10-OME |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Stability of organic physically unclonable function for voltage fractuation. |
| Sub Title (in English) | |
| Keyword(1) | Organic transistor |
| Keyword(2) | Self-assembly |
| Keyword(3) | Low voltage |
| Keyword(4) | Flexible |
| Keyword(5) | Security |
| Keyword(6) | Physically unclonable function |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Kazunori Kuribara |
| 1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 2nd Author's Name | Yohei Hori |
| 2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 3rd Author's Name | Toshihiro Katashita |
| 3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 4th Author's Name | Kazuaki Kakita |
| 4th Author's Affiliation | Ube Industries, Ltd. (Ube Inds.) |
| 5th Author's Name | Yasuhiro Tanaka |
| 5th Author's Affiliation | Ube Industries, Ltd. (Ube Inds.) |
| 6th Author's Name | Manabu Yoshida |
| 6th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
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| Speaker | Author-1 |
| Date Time | 2016-10-28 17:00:00 |
| Presentation Time | 20 minutes |
| Registration for | OME |
| Paper # | OME2016-47 |
| Volume (vol) | vol.116 |
| Number (no) | no.281 |
| Page | pp.39-42 |
| #Pages | 4 |
| Date of Issue | 2016-10-21 (OME) |
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